Escuela Técnica Superior de Ingeniería y Diseño Industrial, Universidad Politécnica de Madrid, Ronda de Valencia 3, 28012 Madrid, Spain.
Sensors (Basel). 2019 Jan 27;19(3):527. doi: 10.3390/s19030527.
This work describes a method for the metrological characterization of structured surfaces using a confocal microscope. The proposed method is based on the calculation of texture parameters established in ISO 25178-2:2012. To ensure the traceability of these parameters, a procedure for the calibration of the Z-axis of the confocal microscope is proposed. The calculation of uncertainty associated with each parameter employs the Monte Carlo method, as well as the concept of a virtual instrument. The validity of the algorithms has been verified through the use of synthetic data provided by the National Institute of Standards and Technology (NIST) and physical standards, with minimum differences being obtained between the certified values and calculated or measured values. Finally, using the proposed method, the topography of a structured surface manufactured by laser machining is evaluated, obtaining the most used roughness parameters, as well as their measurement uncertainties and possible correlations. In general, it can be affirmed that it is possible to obtain metrologically reliable results with the proposed method.
本工作描述了一种使用共焦显微镜对结构表面进行计量特性描述的方法。所提出的方法基于 ISO 25178-2:2012 中建立的纹理参数计算。为了确保这些参数的可溯源性,提出了一种共焦显微镜 Z 轴校准程序。每个参数的不确定度计算均采用蒙特卡罗法和虚拟仪器的概念。通过使用美国国家标准与技术研究院 (NIST) 提供的合成数据和物理标准对算法的有效性进行了验证,在认证值与计算值或测量值之间获得了最小差异。最后,使用所提出的方法对激光加工制造的结构化表面的形貌进行了评估,获得了最常用的粗糙度参数及其测量不确定度和可能的相关性。总的来说,可以肯定的是,使用所提出的方法可以获得计量可靠的结果。