Datta Kaushik, Rittenbach Andrew, Kang Dong-In, Walters John Paul, Crago Stephen P, Damoulakis John
Appl Opt. 2019 Mar 1;58(7):B19-B27. doi: 10.1364/AO.58.000B19.
Ptychographic imaging techniques can be coupled with tomographic image reconstruction techniques to obtain cross-sectional 3D images with resolution on the nanometer scale. However, such ptychographic x-ray computed tomography (PXCT) techniques require the collection of a large number of diffraction patterns. This work derives a set of equations that can be used to calculate the rate at which data can be collected given an experimental setup. It also determines the computational system requirements needed to process ptychographic data in real time as soon as it has been collected. This will expedite the ptychography step of PXCT. These theoretical results are then applied to performance data collected from reconstructing simulated diffraction patterns in order to determine the computational resources needed for real-time ptychographic processing for representative experimental setups. All of our results are independent of any specific ptychographic reconstruction algorithm.
叠层成像技术可以与断层图像重建技术相结合,以获得具有纳米级分辨率的横截面三维图像。然而,这种叠层X射线计算机断层扫描(PXCT)技术需要收集大量的衍射图案。这项工作推导了一组方程,可用于根据实验装置计算数据收集速率。它还确定了在叠层数据收集后立即进行实时处理所需的计算系统要求。这将加快PXCT的叠层成像步骤。然后将这些理论结果应用于从重建模拟衍射图案收集的性能数据,以确定代表性实验装置进行实时叠层处理所需的计算资源。我们所有的结果都独立于任何特定的叠层重建算法。