利用高分辨率和高灵敏度叠层X射线计算机断层扫描对丁苯橡胶中二氧化硅纳米填料进行三维纳米尺度成像

Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed Tomography.

作者信息

Okawa Naru, Ishiguro Nozomu, Takazawa Shuntaro, Uematsu Hideshi, Sasaki Yuhei, Abe Masaki, Ozaki Kyosuke, Honjo Yoshiaki, Nishino Haruki, Joti Yasumasa, Hatsui Takaki, Takahashi Yukio

机构信息

International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, 468-1 Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8572, Japan.

Department of Metallurgy, Graduate School of Engineering, Tohoku University, Aoba-yama 02, Aoba-ku, Sendai 980-8579, Japan.

出版信息

Microsc Microanal. 2024 Nov 4;30(5):836-843. doi: 10.1093/mam/ozae094.

DOI:10.1093/mam/ozae094

PMID:39298155

Abstract

SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of -75° to +75° angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.

摘要

使用叠层X射线计算机断层扫描（PXCT）观察了丁苯橡胶（SBR）中的二氧化硅聚集体。橡胶复合材料用全反射聚焦镜聚焦的X射线照射，并使用CITIUS探测器在-75°至+75°入射角范围内收集叠层衍射图案。橡胶复合材料的投影图像以76 nm的二维分辨率重建，在PXCT测量过程中未观察到明显的结构变化。橡胶复合材料的三维图像以98 nm的各向同性分辨率重建。基于相移的直方图分析从SBR中分割出二氧化硅，揭示了相互连接的二氧化硅聚集体的破碎网络结构。