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通过偏振波前整形实现轴向偏移微分干涉对比显微镜技术。

Axially-offset differential interference contrast microscopy via polarization wavefront shaping.

作者信息

Ding Changqin, Li Chen, Deng Fengyuan, Simpson Garth J

出版信息

Opt Express. 2019 Feb 18;27(4):3837-3850. doi: 10.1364/OE.27.003837.

DOI:10.1364/OE.27.003837
PMID:30876008
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6410925/
Abstract

Sample-scan phase contrast imaging was demonstrated by producing and coherently recombining light from a pair of axially offset focal planes. Placing a homogeneous medium in one of the two focal planes enables quantitative phase imaging using only common-path optics, recovering absolute phase without halo or oblique-illumination artifacts. Axially offset foci separated by 70 μm with a 10x objective were produced through polarization wavefront shaping using a matched pair of custom-designed microretarder arrays, compatible with retrofitting into conventional commercial microscopes. Quantitative phase imaging was achieved by two complementary approaches: i) rotation of a half wave plate, and ii) 50 kHz polarization modulation with lock-in amplification for detection.

摘要

通过产生并相干重组来自一对轴向偏移焦平面的光,展示了样本扫描相衬成像。在两个焦平面之一中放置均匀介质,仅使用共光路光学器件即可实现定量相成像,可恢复绝对相位而无光晕或斜照伪影。使用一对定制设计的微延迟器阵列进行偏振波前整形,产生了由10倍物镜分隔70μm的轴向偏移焦点,该阵列与改装到传统商用显微镜兼容。通过两种互补方法实现了定量相成像:i)半波片的旋转,以及ii)采用锁相放大检测的50kHz偏振调制。

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