Pan An, Yao Baoli
Opt Express. 2019 Feb 18;27(4):5433-5446. doi: 10.1364/OE.27.005433.
A multiple slices approach in ptychography, termed 3ePIE algorithm, solves the multiple scattering problems of thick samples, which is crucial to biomedical imaging and in situ studies. However, it is unclear how many slices need to be separated and what the distance is between each layer respectively, while these two parameters are sensitive and crucial to the recovery of thick samples. The traditional method is to separate the sample with the same interval for convenience and to test the number of sections for the best reconstructions, which is reasonable for continuous samples and has achieved great results. But this kind of segmentation approach may not be scientific enough for those discrete samples with an uneven spatial distribution. The two inaccurate parameters may yield the algorithm to diverge or generate artifacts, and the empty slices may decrease the reconstruction quality and increase computation time. In addition, repeatedly testing the number of slices is tedious work even for a continuous sample. To this end, a genetic algorithm-based 3ePIE approach, termed the GA-3ePIE method, is proposed to retrieve both the interval between each layer and the number of slices. The performance is verified by both simulations and experiments. The maximum number of sections that can be resolved is also investigated in numerical analysis, which is associated with the sampling and overlap rate in a spatial domain. Our method can be also promoted to image thick samples with coherent X-rays and in the electron regime. The limitations of our method are also discussed.
叠层成像术中的一种多切片方法,称为3ePIE算法,可解决厚样品的多重散射问题,这对生物医学成像和原位研究至关重要。然而,尚不清楚需要分隔多少个切片以及每层之间的距离分别是多少,而这两个参数对厚样品的恢复很敏感且至关重要。传统方法是为方便起见以相同间隔分隔样品,并测试切片数量以获得最佳重建效果,这对于连续样品是合理的且已取得了很好的结果。但这种分割方法对于那些空间分布不均匀的离散样品可能不够科学。这两个不准确的参数可能会导致算法发散或产生伪影,并且空切片可能会降低重建质量并增加计算时间。此外,即使对于连续样品,反复测试切片数量也是繁琐的工作。为此,提出了一种基于遗传算法的3ePIE方法,称为GA - 3ePIE方法,以检索每层之间的间隔和切片数量。通过模拟和实验验证了其性能。在数值分析中还研究了可分辨的最大切片数量,这与空间域中的采样和重叠率有关。我们的方法也可推广到用相干X射线和电子模式对厚样品进行成像。我们还讨论了该方法的局限性。