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用于混合粒子场剂量测定的闪烁体中的电离猝灭。

Ionization quenching in scintillators used for dosimetry of mixed particle fields.

机构信息

Center for Nuclear Technologies, Technical University of Denmark, Roskilde, Denmark.

出版信息

Phys Med Biol. 2019 Apr 29;64(9):095018. doi: 10.1088/1361-6560/ab12f2.

Abstract

Ionization quenching in ion beam dosimetry is often related to the fluence- or dose-averaged linear energy transfer (LET). Both quantities are however averaged over a wide LET range and a mixed field of primary and secondary ions. We propose a novel method to correct the quenched luminescence in scintillators exposed to ion beams. The method uses the energy spectrum of the primaries and accounts for the varying quenched luminescence in heavy, secondary ion tracks through amorphous track structure theory. The new method is assessed against more traditional approaches by correcting the quenched luminescence response from the BCF-12, BCF-60, and 81-0084 plastic scintillators exposed to a 100 MeV pristine proton beam in order to compare the effects of the averaged LET quantities and the secondary ions. Calculations and measurements show that primary protons constitute more than 92% of the energy deposition but account for more than 95% of the luminescence signal in the scintillators. The quenching corrected luminescence signal is in better agreement with the dose measurement when the secondary particles are taken into account. The Birks model provided the overall best quenching corrections, when the quenching corrected signal is adjusted for the number of free model parameters. The quenching parameter kB for the BCF-12 and BCF-60 scintillators is in agreement with literature values and was found to be [Formula: see text] [Formula: see text]m keV for the 81-0084 scintillator. Finally, a fluence threshold for the 100 MeV proton beam was calculated to be of the order of 10 cm, corresponding to 110 Gy, above which the quenching increases non-linearly and the Birks model no longer is applicable.

摘要

在离子束剂量学中,离子化猝灭通常与剂量平均线性能量传递(LET)有关。然而,这两个量都是在宽 LET 范围内和初级离子和次级离子的混合场中平均的。我们提出了一种新的方法来校正暴露于离子束的闪烁体中的猝灭发光。该方法使用初级粒子的能谱,并通过非晶轨迹结构理论来解释重离子和次级离子轨迹中猝灭发光的变化。通过校正 BCF-12、BCF-60 和 81-0084 塑料闪烁体在 100 MeV 原始质子束照射下的猝灭发光响应,来评估新方法与更传统方法的对比,以比较平均 LET 量和次级离子的影响。计算和测量表明,初级质子构成了超过 92%的能量沉积,但在闪烁体中却占超过 95%的发光信号。当考虑次级粒子时,猝灭校正后的发光信号与剂量测量更吻合。当调整 Birks 模型的自由模型参数数量时,Birks 模型提供了整体最佳的猝灭校正。对于 BCF-12 和 BCF-60 闪烁体,猝灭参数 kB 与文献值一致,并且发现 81-0084 闪烁体的 kB 值为 [公式:见文本] [公式:见文本]m keV。最后,计算了 100 MeV 质子束的通量阈值约为 10 cm,对应于 110 Gy 以上,猝灭作用呈非线性增加,并且 Birks 模型不再适用。

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