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钙钛矿CsPbBr量子点与拓扑绝缘体BiSe薄膜异质结构中的超快激子转移

Ultrafast exciton transfer in perovskite CsPbBr quantum dots and topological insulator BiSe film heterostructure.

作者信息

Tang Yuxiang, Jiang Tian, Zhou Tong, Hao Hao, Wei Ke, Li Han, You Jie, Wang Zhenyu, Zheng Xin, Xu Zhongjie, Cheng Xiang'ai

机构信息

College of Advanced Interdisciplinary Studies, National University of Defence Technology, Changsha, Hunan 401173, People's Republic of China.

出版信息

Nanotechnology. 2019 Aug 9;30(32):325702. doi: 10.1088/1361-6528/ab166f. Epub 2019 Apr 5.

Abstract

Recently, topological insulator based heterostructures (HSs) have attracted tremendous research interest, due to their efficient carrier transfer features at the heterointerface induced by metallic surface states. Here, a novel HS comprising 0D perovskite CsPbBr quantum dots (QDs) and 2D material topological insulator BiSe film is proposed and experimentally investigated. Specifically, steady state and time-resolved photoluminescence (PL) measurements are employed, from which a significant quenching behaviour is observed in the HS, with an average quenching factor of 93.2 ± 0.8%. Additionally, time-resolved PL spectroscopy affirms that the carrier transfer efficiency can be up to 92.6 ± 0.2%. Furthermore, the dynamics of carrier transfer within the 0D-2D HS are characterized by utilizing femtosecond broadband transient absorption (TA) spectroscopy, revealing an ultrafast exciton transfer from photoexcited CsPbBr QDs to the BiSe film with a time-scale around 1.1 ± 0.2 ps. An alternative important finding is that the band renormalization is exhibited in CsPbBr QDs of the HS, with the dominant factor being the Coulomb screening effect. This work is expected to provide some fundamental understanding of the ultrafast and efficient carrier transfer mechanism underneath HSs based on topological insulators.

摘要

最近,基于拓扑绝缘体的异质结构(HSs)因其在金属表面态诱导的异质界面处具有高效的载流子转移特性而引起了极大的研究兴趣。在此,我们提出并通过实验研究了一种由0D钙钛矿CsPbBr量子点(QDs)和2D材料拓扑绝缘体BiSe薄膜组成的新型HS。具体而言,我们采用了稳态和时间分辨光致发光(PL)测量,从中观察到HS中存在显著的猝灭行为,平均猝灭因子为93.2±0.8%。此外,时间分辨PL光谱证实载流子转移效率可达92.6±0.2%。此外,利用飞秒宽带瞬态吸收(TA)光谱对0D-2D HS内的载流子转移动力学进行了表征,揭示了光激发的CsPbBr量子点到BiSe薄膜的超快激子转移,时间尺度约为1.1±0.2 ps。另一个重要发现是,HS的CsPbBr量子点中表现出能带重整化,主要因素是库仑屏蔽效应。这项工作有望为基于拓扑绝缘体的HSs下方超快高效的载流子转移机制提供一些基本认识。

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