Yang Zhi-Xin, Sun Jun-Yi, Li Ke, Lian Yong-Sheng, He Xiao-Ting, Zheng Zhou-Lian
School of Civil Engineering, Chongqing University, Chongqing 400045, China.
Key Laboratory of New Technology for Construction of Cities in Mountain Area (Chongqing University), Ministry of Education, Chongqing 400045, China.
Polymers (Basel). 2018 Jan 7;10(1):49. doi: 10.3390/polym10010049.
In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film with initial stress was analytically solved and its closed-form solution was presented. The expressions to determine Poisson's ratios, Young's modulus, and residual stress of surface thin films were derived; the work done by the applied external load and the elastic energy stored in the blistering thin film were analyzed in detail and their expressions were derived; and the interfacial adhesion energy released per unit delamination area of thin-film/substrate (i.e., energy release rate) was finally presented. The synchronous characterization technique presented here has theoretically made a big step forward, due to the consideration for the residual stress in surface thin films.
在本研究中，基于压力水泡试验技术，对具有残余应力的薄膜/基底系统的表面和界面力学性能同步表征进行了理论研究，其中解析求解了具有初始应力的起泡薄膜的轴对称变形问题，并给出了其闭式解。推导了确定表面薄膜泊松比、杨氏模量和残余应力的表达式；详细分析了外加荷载所做的功以及起泡薄膜中储存的弹性能，并推导了它们的表达式；最后给出了薄膜/基底每单位分层面积释放的界面粘附能（即能量释放率）。由于考虑了表面薄膜中的残余应力，这里提出的同步表征技术在理论上向前迈出了一大步。
