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薄膜/基底系统表面和界面力学性能的改进同步表征理论:轴加载水泡试验技术的理论研究

Improved Synchronous Characterization Theory for Surface and Interface Mechanical Properties of Thin-Film/Substrate Systems: A Theoretical Study on Shaft-Loaded Blister Test Technique.

作者信息

He Xiao-Ting, Li Xiang, Feng He-Hao, Sun Jun-Yi

机构信息

School of Civil Engineering, Chongqing University, Chongqing 400045, China.

Key Laboratory of New Technology for Construction of Cities in Mountain Area (Chongqing University), Ministry of Education, Chongqing 400045, China.

出版信息

Materials (Basel). 2024 Oct 16;17(20):5054. doi: 10.3390/ma17205054.

DOI:10.3390/ma17205054
PMID:39459759
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11509746/
Abstract

In this paper, the previously proposed shaft-loaded blister test technique for the synchronous characterization of the surface and interface mechanical properties of a thin-film/substrate system is further studied theoretically. The large deflection problem of the steady shaft-loaded blistering thin film is reformulated by surrendering the small-rotation-angle assumption of the membrane, which was previously adopted in the out-of-plane and in-plane equilibrium and radial geometric equations. A new and more accurate analytical solution to this large deflection problem is presented and is used to improve the previously presented synchronous characterization theory. The new analytical solution is numerically compared with the previous analytical solution to confirm the superiority of the new analytical solution over the previous analytical solution. An experiment is conducted to verify the beneficial effect of the improved synchronous characterization theory on improving the characterization accuracy.

摘要

本文对先前提出的用于同步表征薄膜/衬底系统表面和界面力学性能的轴加载泡罩试验技术进行了进一步的理论研究。通过放弃先前在面外和面内平衡以及径向几何方程中采用的薄膜小旋转角假设,重新阐述了稳态轴加载泡罩薄膜的大挠度问题。给出了该大挠度问题的一种新的、更精确的解析解,并用于改进先前提出的同步表征理论。将新的解析解与先前的解析解进行数值比较,以确认新解析解相对于先前解析解的优越性。进行了一项实验,以验证改进后的同步表征理论对提高表征精度的有益效果。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/0869c78eb62f/materials-17-05054-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/d14b90b39504/materials-17-05054-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/5c37daa1d75d/materials-17-05054-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/f4725bda08b4/materials-17-05054-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/b4c02d41bebb/materials-17-05054-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/b88b36754a07/materials-17-05054-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/0869c78eb62f/materials-17-05054-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/d14b90b39504/materials-17-05054-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/5c37daa1d75d/materials-17-05054-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/f4725bda08b4/materials-17-05054-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/b4c02d41bebb/materials-17-05054-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/b88b36754a07/materials-17-05054-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8886/11509746/0869c78eb62f/materials-17-05054-g006.jpg

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