Schefold Joris, Meuret Sophie, Schilder Nick, Coenen Toon, Agrawal Harshal, Garnett Erik C, Polman Albert
Center for Nanophotonics, AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.
Delmic B.V., Kanaalweg 4, 2628 EB Delft, The Netherlands.
ACS Photonics. 2019 Apr 17;6(4):1067-1072. doi: 10.1021/acsphotonics.9b00164. Epub 2019 Feb 26.
We investigate the nanoscale excitation of Ag nanocubes with coherent cathodoluminescence imaging spectroscopy (CL) to resolve the factors that determine the spatial resolution of CL as a deep-subwavelength imaging technique. The 10-30 keV electron beam coherently excites localized plasmons in 70 nm Ag cubes at 2.4 and 3.1 eV. The radiation from these plasmon modes is collected in the far-field together with the secondary electron intensity. CL line scans across the nanocubes show exponentially decaying tails away from the cube that reveal the evanescent coupling of the electron field to the resonant plasmon modes. The measured CL decay lengths range from 8 nm (10 keV) to 12 nm (30 keV) and differ from the calculated ones by only 1-3 nm. A statistical model of electron scattering inside the Ag nanocubes is developed to analyze the secondary electron images and compare them with the CL data. The Ag nanocube edges are derived from the CL line scans with a systematic error less than 3 nm. The data demonstrate that CL probes the electron-induced plasmon fields with nanometer accuracy.
我们利用相干阴极发光成像光谱(CL)研究了银纳米立方体的纳米级激发,以确定决定CL作为一种深亚波长成像技术的空间分辨率的因素。10 - 30 keV的电子束在70 nm的银立方体中以2.4 eV和3.1 eV相干激发局域等离子体激元。这些等离子体激元模式的辐射与二次电子强度一起在远场收集。穿过纳米立方体的CL线扫描显示,远离立方体的尾部呈指数衰减,这揭示了电子场与共振等离子体激元模式的倏逝耦合。测量得到的CL衰减长度范围从8 nm(10 keV)到12 nm(30 keV),与计算值的差异仅为1 - 3 nm。建立了银纳米立方体内电子散射的统计模型,以分析二次电子图像并将其与CL数据进行比较。通过CL线扫描得出银纳米立方体边缘,系统误差小于3 nm。数据表明,CL能够以纳米精度探测电子诱导的等离子体激元场。