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从头开始的非刚性 X 射线纳米断层摄影术。

Ab initio nonrigid X-ray nanotomography.

机构信息

Paul Scherrer Institut, CH-5232, Villigen PSI, Switzerland.

Big Data Science Center, Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, 239 Zhangheng Road, Pudong, 201204, Shanghai, China.

出版信息

Nat Commun. 2019 Jun 13;10(1):2600. doi: 10.1038/s41467-019-10670-7.

Abstract

Reaching the full potential of X-ray nanotomography, in particular for biological samples, is limited by many factors, of which one of the most serious is radiation damage. Although sample deformation caused by radiation damage can be partly mitigated by cryogenic protection, it is still present in these conditions and, as we exemplify here using a specimen extracted from scales of the Cyphochilus beetle, it will pose a limit to the achievable imaging resolution. We demonstrate a generalized tomographic model, which optimally follows the sample morphological changes and attempts to recover the original sample structure close to the ideal, damage-free reconstruction. Whereas our demonstration was performed using ptychographic X-ray tomography, the method can be adopted for any tomographic imaging modality. Our application demonstrates improved reconstruction quality of radiation-sensitive samples, which will be of increasing relevance with the higher brightness of 4th generation synchrotron sources.

摘要

要充分发挥 X 射线纳米断层成像技术的潜力,特别是在生物样本方面,受到许多因素的限制,其中最严重的因素之一是辐射损伤。尽管通过低温保护可以部分减轻辐射损伤引起的样品变形,但在这些条件下仍然存在,正如我们在这里使用从 Cyphochilus 甲虫鳞片中提取的样本所举例说明的那样,它将对可实现的成像分辨率构成限制。我们展示了一个广义的层析成像模型,该模型可以最佳地跟踪样品形态变化,并尝试尽可能接近理想的、无损伤重建来恢复原始样品结构。虽然我们的演示是使用相衬 X 射线断层成像技术进行的,但该方法可以应用于任何层析成像模式。我们的应用表明,对于对辐射敏感的样品,重建质量得到了改善,随着第四代同步辐射源的亮度提高,这种方法的相关性将会越来越强。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e1f3/6565693/b49612aab5b9/41467_2019_10670_Fig1_HTML.jpg

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