Li Yanxiao, Huang Shuohan, Wei Congjie, Wu Chenglin, Mochalin Vadym N
Department of Civil, Architectural, and Environmental Engineering, Missouri University of Science and Technology, Rolla, MO, 65409, USA.
Department of Chemistry, Missouri University of Science and Technology, Rolla, MO, 65409, USA.
Nat Commun. 2019 Jul 8;10(1):3014. doi: 10.1038/s41467-019-10982-8.
Two-dimensional transition metal carbides (MXenes) have attracted a great interest of the research community as a relatively recently discovered large class of materials with unique electronic and optical properties. Understanding of adhesion between MXenes and various substrates is critically important for MXene device fabrication and performance. We report results of direct atomic force microscopy (AFM) measurements of adhesion of two MXenes (TiCT and TiCT) with a SiO coated Si spherical tip. The Maugis-Dugdale theory was applied to convert the AFM measured adhesion force to adhesion energy, while taking into account surface roughness. The obtained adhesion energies were compared with those for mono-, bi-, and tri-layer graphene, as well as SiO substrates. The average adhesion energies for the MXenes are 0.90 ± 0.03 J m and 0.40 ± 0.02 J m for thicker TiCT and thinner TiCT, respectively, which is of the same order of magnitude as that between graphene and silica tip.
二维过渡金属碳化物(MXenes)作为一类相对较新发现的具有独特电子和光学性质的材料,引起了研究界的极大兴趣。了解MXenes与各种衬底之间的粘附力对于MXene器件的制造和性能至关重要。我们报告了使用涂有SiO的Si球形尖端对两种MXenes(TiCT和TiCT)的粘附力进行直接原子力显微镜(AFM)测量的结果。在考虑表面粗糙度的情况下,应用Maugis-Dugdale理论将AFM测量的粘附力转换为粘附能。将获得的粘附能与单层、双层和三层石墨烯以及SiO衬底的粘附能进行了比较。对于较厚的TiCT和较薄的TiCT,MXenes的平均粘附能分别为0.90±0.03 J m和0.40±0.02 J m,这与石墨烯和二氧化硅尖端之间的粘附能处于同一数量级。