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杨-费曼双缝电子干涉控制实验。

The Young-Feynman controlled double-slit electron interference experiment.

作者信息

Tavabi Amir H, Boothroyd Chris B, Yücelen Emrah, Frabboni Stefano, Gazzadi Gian Carlo, Dunin-Borkowski Rafal E, Pozzi Giulio

机构信息

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungzentrum Jülich, 52425, Jülich, Germany.

School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore.

出版信息

Sci Rep. 2019 Jul 18;9(1):10458. doi: 10.1038/s41598-019-43323-2.

DOI:10.1038/s41598-019-43323-2
PMID:31320696
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6639407/
Abstract

The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.

摘要

量子力学的关键特征通过杨氏 - 费曼双缝思想实验得到了生动的说明,该实验的第二部分讨论了用一个孔径部分或完全封闭双缝之一时电子分布的记录。在这里,我们在配备高亮度电子枪和两个双棱镜的现代电子显微镜中实现了最初的费曼提议,其中一个双棱镜用作掩模。通过激发显微镜透镜使双棱镜平面与狭缝平面共轭,在夫琅禾费平面进行观察,对其中一个狭缝的覆盖情况进行近乎理想的控制。还提出了第二个新实验,其中在像平面中观察到由于狭缝部分重叠而产生的干涉现象。这种情况是通过在两个狭缝和第一个双棱镜之间插入第二个双棱镜并对其进行偏置以使它们的图像重叠来实现的。

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The Young-Feynman controlled double-slit electron interference experiment.杨-费曼双缝电子干涉控制实验。
Sci Rep. 2019 Jul 18;9(1):10458. doi: 10.1038/s41598-019-43323-2.
2
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up.双缝实验中的弹性和非弹性电子:费曼“哪条路径”设置的一种变体。
Ultramicroscopy. 2015 Jul;154:49-56. doi: 10.1016/j.ultramic.2015.03.006. Epub 2015 Mar 11.
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Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope.利用 1.2MV 场发射透射电子显微镜进行非对称双缝的干涉实验。
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"Either-or" two-slit interference: stable coherent propagation of individual photons through separate slits.“非此即彼”双缝干涉:单个光子通过分开的狭缝的稳定相干传播。
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Optical Control of Young's Type Double-slit Interferometer for Laser-induced Electron Emission from a Nano-tip.用于纳米尖端激光诱导电子发射的杨氏双缝干涉仪的光学控制
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: transmission electron microscopy simulation software for teaching and training of microscope operation.用于显微镜操作教学与培训的透射电子显微镜模拟软件。
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本文引用的文献

1
Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope.利用 1.2MV 场发射透射电子显微镜进行非对称双缝的干涉实验。
Sci Rep. 2018 Jan 17;8(1):1008. doi: 10.1038/s41598-018-19380-4.
2
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up.双缝实验中的弹性和非弹性电子:费曼“哪条路径”设置的一种变体。
Ultramicroscopy. 2015 Jul;154:49-56. doi: 10.1016/j.ultramic.2015.03.006. Epub 2015 Mar 11.
3
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy.
通过单色光子的非对称双缝实验进行路径识别。
Sci Rep. 2022 Mar 8;12(1):3709. doi: 10.1038/s41598-022-07662-x.
4
Interference and interferometry in electron holography.电子全息术中的干涉与干涉测量法。
Microscopy (Oxf). 2021 Feb 1;70(1):3-16. doi: 10.1093/jmicro/dfaa033.
电子能量损失谱的空间、能量和动量分辨率的限制。
Ultramicroscopy. 2007 Aug;107(8):575-86. doi: 10.1016/j.ultramic.2006.11.005. Epub 2007 Jan 9.