Yang Wanli, Fan Shuaiqi, Liang Yuxing, Hu Yuantai
Department of Mechanics, Hubei Key Laboratory of Engineering Structural Analysis and Safety Assessment, Huazhong University of Science and Technology, Wuhan 430074, China.
Beilstein J Nanotechnol. 2019 Sep 6;10:1833-1843. doi: 10.3762/bjnano.10.178. eCollection 2019.
A model is proposed to study the diffusion of non-equilibrium minority carriers under the influence of a piezo potential and to calculate the corresponding current-voltage (-) characteristics of a piezoelectric p-n junction exposed to mechanical loading. An effective solution to describe this non-equilibrium process has been put forward including two concepts: the influence of prestress loading on p-n junctions in a quasi-electrostatic thermal equilibrium and the perturbation of small fields superposed on the obtained quasi-electrostatic solutions. A few useful results are obtained through this loaded p-n junction model. Under a forward-bias voltage, a tensile (compressive) loading raises (reduces) the potential barrier of the space charge zone (SCZ), i.e., produces an equivalent reverse- (forward-) electric voltage on the SCZ. When a piezoelectric p-n junction is exposed to a reverse-bias voltage, the current density monotonically decreases with increasing reverse voltage and gradually approaches saturation. A bigger tensile (compressive) loading produces a smaller (larger) saturation current density. The appearance of an equivalent voltage on the SCZ induced by prestress indicates that the performance of a p-n junction with the piezo effect can be effectively tuned and controlled by mechanical loadings. Meanwhile, numerical results show that a loading location closer to the SCZ produces a stronger effect on the - characteristics of a piezoelectric p-n junction, implying that the tuning effect of mechanical loadings depends on how much influence of the deformation-induced electric field can reach the SCZ. Furthermore, it is also found that the deformation-induced electric field becomes weak with increasing doping because the higher doping is corresponding to the stronger electric leakage. Thus, the higher mechanical tuning performance on higher doped piezoelectric p-n junctions requires the prestress loadings to be applied closer to the interface of p- and n-zone. This study on a non-equilibrium process of piezoelectric p-n junctions has significance for piezotronics.
提出了一个模型,用于研究非平衡少数载流子在压电势影响下的扩散,并计算承受机械载荷的压电 p-n 结的相应电流-电压(I-V)特性。提出了一种描述这种非平衡过程的有效解决方案,包括两个概念:准静电热平衡中预应力载荷对 p-n 结的影响以及叠加在所得准静电解上的小场扰动。通过这个加载 p-n 结模型获得了一些有用的结果。在正向偏置电压下,拉伸(压缩)载荷会提高(降低)空间电荷区(SCZ)的势垒,即在 SCZ 上产生等效的反向(正向)电压。当压电 p-n 结承受反向偏置电压时,电流密度随反向电压增加而单调减小,并逐渐趋于饱和。更大的拉伸(压缩)载荷会产生更小(更大)的饱和电流密度。预应力在 SCZ 上引起的等效电压的出现表明,具有压电效应的 p-n 结的性能可以通过机械载荷有效地调节和控制。同时,数值结果表明,加载位置越靠近 SCZ 对压电 p-n 结的 I-V 特性影响越强,这意味着机械载荷的调节效果取决于变形感应电场能到达 SCZ 的影响程度。此外,还发现随着掺杂增加,变形感应电场会变弱,因为更高的掺杂对应更强的漏电。因此,对于更高掺杂的压电 p-n 结,更高的机械调谐性能要求预应力载荷更靠近 p 区和 n 区的界面施加。对压电 p-n 结非平衡过程的这项研究对压电子学具有重要意义。