Piveteau Laura, Dirin Dmitry N, Gordon Christopher P, Walder Brennan J, Ong Ta-Chung, Emsley Lyndon, Copéret Christophe, Kovalenko Maksym V
Department of Chemistry and Applied Biosciences, ETH Zürich, Vladimir Prelog Weg 1-5, Zurich CH-8093, Switzerland.
Empa-Swiss Federal Laboratories for Materials Science and Technology, Dübendorf, Überlandstrasse 129, Zurich CH-8600, Switzerland.
Nano Lett. 2020 May 13;20(5):3003-3018. doi: 10.1021/acs.nanolett.9b04870. Epub 2020 Apr 29.
Ligand exchange and CdS shell growth onto colloidal CdSe nanoplatelets (NPLs) using colloidal atomic layer deposition (c-ALD) were investigated by solid-state nuclear magnetic resonance (NMR) experiments, in particular, dynamic nuclear polarization (DNP) enhanced phase adjusted spinning sidebands-phase incremented echo-train acquisition (PASS-PIETA). The improved sensitivity and resolution of DNP enhanced PASS-PIETA permits the identification and study of the core, shell, and surface species of CdSe and CdSe/CdS core/shell NPLs heterostructures at all stages of c-ALD. The cadmium chemical shielding was found to be proportionally dependent on the number and nature of coordinating chalcogen-based ligands. DFT calculations permitted the separation of the the Cd chemical shielding into its different components, revealing that the varying strength of paramagnetic and spin-orbit shielding contributions are responsible for the chemical shielding trend of cadmium chalcogenides. Overall, this study points to the roughening and increased chemical disorder at the surface during the shell growth process, which is not readily captured by the conventional characterization tools such as electron microscopy.
通过固态核磁共振(NMR)实验,特别是动态核极化(DNP)增强的相位调整旋转边带 - 相位递增回波串采集(PASS - PIETA),研究了使用胶体原子层沉积(c - ALD)在胶体CdSe纳米片(NPLs)上进行配体交换和CdS壳层生长的过程。DNP增强的PASS - PIETA所提高的灵敏度和分辨率,使得在c - ALD的各个阶段都能够识别和研究CdSe以及CdSe/CdS核/壳NPLs异质结构的核、壳和表面物种。发现镉的化学屏蔽与基于硫族元素的配位配体的数量和性质成比例相关。密度泛函理论(DFT)计算能够将镉的化学屏蔽分离为不同的组分,揭示出顺磁和自旋轨道屏蔽贡献强度的变化是造成硫族镉化物化学屏蔽趋势的原因。总体而言,这项研究表明在壳层生长过程中表面会出现粗糙度增加和化学无序度增大的情况,而传统的表征工具如电子显微镜则难以捕捉到这些情况。