在下颌种植支持覆盖义齿二期手术中，传统激光与二极管激光对骨内种植体周围嵴顶骨水平影响的比较评估：一项研究。
Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An study.
作者信息
Bajaj Sushant, Rani Sapna, Issar Gaurav, Sethi Upasana, Kumar Shalabh, Mishra Sarvesh
机构信息
Department of Prosthodontics, ITS-CDSR, Uttar Pradesh, India.
Department of Oral Medicine and Radiology, ITS-CDSR, Uttar Pradesh, India.
出版信息
J Indian Prosthodont Soc. 2020 Jan-Mar;20(1):52-60. doi: 10.4103/jips.jips_55_19. Epub 2020 Jan 27.
AIM
This study aims to evaluate and compare the crestal bone levels around implants as influenced by conventional and diode laser during second-stage surgery in an edentulous mandible using cone beam computed tomography (CBCT) and digital radiography (DR).
SETTINGS AND DESIGN
A split-mouth prospective study on edentulous patients involving placement of two implants in mandible followed by the comparison of two different techniques for second-stage surgery.
MATERIALS AND METHODS
The study was undertaken to evaluate the crestal bone change around 16 implant sites distributed in two groups (eight implants each) following two methods during second-stage surgery, i.e., Group 1 - Conventional second stage and Group 2 - Diode laser. Measurements were made on two sides (mesial and distal) using intraoral periapical and four sides (labial, lingual, mesial, and distal) using CBCT scans for both groups. These measurements were conducted at two time intervals for both, i.e., immediately after implant loading and twenty 4 weeks after implant loading. The values obtained were subjected to statistical analysis.
STATISTICAL ANALYSIS USED
The normality of data was checked by Shapiro-Wilk's test. Intragroup comparison was compared using independent -test by comparison by Bonferroni method ( < 0.05).
RESULTS
Crestal bone loss at the time of loading for Group 1 evaluated by CBCT was 0.950 ± 0.988 while after 24 weeks of loading, it was 1.388 ± 0.576. For Group 2, mean crestal bone loss was 1.200 ± 0.925 at the time of loading, and after 24 weeks, it was 1.512 ± 0.674. Crestal bone loss at the time of loading for Group 1 evaluated by DR was 1.075 ± 0.849 while after 24 weeks of loading, it was 1.562 ± 0.480. For Group 2, mean crestal bone loss was 1.162 ± 0.833 at the time of loading and after 24 weeks, it was 1.700 ± 0.498.
CONCLUSIONS
In the present study, no statistically significant difference was observed in crestal bone loss between conventional and diode laser technique.
目的
本研究旨在使用锥形束计算机断层扫描（CBCT）和数字放射成像（DR），评估和比较在下颌无牙颌二期手术中，传统方法和二极管激光对种植体周围嵴顶骨水平的影响。
设置与设计
一项针对无牙颌患者的半口前瞻性研究，在下颌植入两颗种植体，然后比较二期手术的两种不同技术。
材料与方法
本研究旨在评估二期手术期间，按照两种方法在16个种植位点（每组8颗种植体）周围的嵴顶骨变化，即第1组 - 传统二期手术，第2组 - 二极管激光。两组均使用口内根尖片在两侧（近中和远中）进行测量，并使用CBCT扫描在四面（唇侧、舌侧、近中、远中）进行测量。这些测量在两个时间点进行，即种植体加载后立即测量，以及种植体加载后24周测量。对获得的值进行统计分析。
所用统计分析方法
数据的正态性通过Shapiro-Wilk检验进行检查。组内比较采用独立样本t检验，组间比较采用Bonferroni法（P<0.05）。
结果
通过CBCT评估，第1组在加载时的嵴顶骨吸收为0.950±0.988，加载24周后为1.388±0.576。第2组在加载时的平均嵴顶骨吸收为1.200±0.925，24周后为1.512±0.674。通过DR评估，第1组在加载时的嵴顶骨吸收为1.075±0.849，加载24周后为1.562±0.480。第2组在加载时的平均嵴顶骨吸收为1.162±0.83
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