Zhou Tunhe, Wang Hongchang, Fox Oliver, Sawhney Kawal
Opt Express. 2018 Oct 15;26(21):26961-26970. doi: 10.1364/OE.26.026961.
Significant improvements have been made in the fabrication of diffraction-limited X-ray optics used to pursue an aberration-free wavefront. Alignment of these optics plays a crucial role in the resultant beam quality. Here, we present a simple and fast alignment method based on imaging X-ray near-field speckle patterns, with experimental demonstration using a pair of Kirkpatrick-Baez mirrors. The proposed technique has the potential to be an alternative to conventional methods. It loosens the stringent demand for high-resolution scanning stages compared to conventional knife-edge scan and, hence, can be applied to nano-focusing optics. The flexibility and straightforward implementation of the method allow it to be applied to a wide range of experiments at synchrotron facilities and laboratory-based sources.
在用于实现无像差波前的衍射极限X射线光学器件制造方面已取得了显著进展。这些光学器件的对准对最终的光束质量起着至关重要的作用。在此，我们提出一种基于对X射线近场散斑图案成像的简单快速对准方法，并使用一对柯克帕特里克-贝兹镜进行了实验演示。所提出的技术有可能成为传统方法的替代方法。与传统的刀口扫描相比，它放宽了对高分辨率扫描平台的严格要求，因此可应用于纳米聚焦光学器件。该方法的灵活性和直接实施方式使其能够应用于同步加速器设施和基于实验室的光源的广泛实验中。
