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使用 JUNGFRAU 像素探测器进行连续大分子晶体学的 X 射线荧光检测。

X-ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector.

机构信息

Paul Scherrer Institute, Forschungsstrasse 111, Villigen 5232, Switzerland.

出版信息

J Synchrotron Radiat. 2020 Mar 1;27(Pt 2):329-339. doi: 10.1107/S1600577519016758. Epub 2020 Feb 7.

Abstract

Detection of heavy elements, such as metals, in macromolecular crystallography (MX) samples by X-ray fluorescence is a function traditionally covered at synchrotron MX beamlines by silicon drift detectors, which cannot be used at X-ray free-electron lasers because of the very short duration of the X-ray pulses. Here it is shown that the hybrid pixel charge-integrating detector JUNGFRAU can fulfill this function when operating in a low-flux regime. The feasibility of precise position determination of micrometre-sized metal marks is also demonstrated, to be used as fiducials for offline prelocation in serial crystallography experiments, based on the specific fluorescence signal measured with JUNGFRAU, both at the synchrotron and at SwissFEL. Finally, the measurement of elemental absorption edges at a synchrotron beamline using JUNGFRAU is also demonstrated.

摘要

利用 X 射线荧光探测大分子晶体学 (MX) 样品中的重元素,如金属,是传统上在同步加速器 MX 光束线上由硅漂移探测器完成的功能,但由于 X 射线脉冲持续时间非常短,硅漂移探测器不能用于 X 射线自由电子激光器。这里表明,在低通量模式下工作时,混合像素积分电荷探测器 JUNGFRAU 可以完成此功能。还证明了微尺度金属标记的精确位置确定的可行性,以便在基于 JUNGFRAU 测量的特定荧光信号的基础上,在同步加速器和瑞士 FEL 上的串行晶体学实验中用作离线预定位的基准。最后,还证明了使用 JUNGFRAU 在同步加速器光束线上测量元素吸收边。

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