Muhammad Fida, Tahir Muhammad, Zeb Muhammad, Kalasad Muttanagoud N, Mohd Said Suhana, Sarker Mahidur R, Sabri Mohd Faizul Mohd, Ali Sawal Hamid Md
Department of Physics, Faculty of Physical and Numerical Sciences, Abdul Wali Khan University Mardan, Mardan, 23200, Khyber Pakhtunkhwa, Pakistan.
Electronics & Nanoscale Engineering, School of Engineering, University of Glasgow, Glasgow, G12 8QQ, UK.
Sci Rep. 2020 Mar 16;10(1):4828. doi: 10.1038/s41598-020-61602-1.
This paper reports the potential application of cadmium selenide (CdSe) quantum dots (QDs) in improving the microelectronic characteristics of Schottky barrier diode (SBD) prepared from a semiconducting material poly-(9,9-dioctylfluorene) (F8). Two SBDs, Ag/F8/P3HT/ITO and Ag/F8-CdSe QDs/P3HT/ITO, are fabricated by spin coating a 10 wt% solution of F8 in chloroform and 10:1 wt% solution of F8:CdSe QDs, respectively, on a pre-deposited poly(3-hexylthiophene) (P3HT) on indium tin oxide (ITO) substrate. To study the electronic properties of the fabricated devices, current-voltage (I-V) measurements are carried out at 25 °C in dark conditions. The I-V curves of Ag/F8/P3HT/ITO and Ag/F8-CdSe QDs/P3HT/ITO SBDs demonstrate asymmetrical behavior with forward bias current rectification ratio (RR) of 7.42 ± 0.02 and 142 ± 0.02, respectively, at ± 3.5 V which confirm the formation of depletion region. Other key parameters which govern microelectronic properties of the fabricated devices such as charge carrier mobility (µ), barrier height (ϕ), series resistance (R) and quality factor (n) are extracted from their corresponding I-V characteristics. Norde's and Cheung functions are also applied to characterize the devices to study consistency in various parameters. Significant improvement is found in the values of R, n, and RR by 3, 1.7, and 19 times, respectively, for Ag/F8-CdSe QDs/P3HT/ITO SBD as compared to Ag/F8/P3HT/ITO. This enhancement is due to the incorporation of CdSe QDs having 3-dimensional quantum confinement and large surface-to-volume area. Poole-Frenkle and Richardson-Schottky conduction mechanisms are also discussed for both of the devices. Morphology, optical bandgap (1.88 ± 0.5 eV) and photoluminescence (PL) spectrum of CdSe QDs with a peak intensity at 556 nm are also reported and discussed.
本文报道了硒化镉(CdSe)量子点(QDs)在改善由半导体材料聚(9,9 - 二辛基芴)(F8)制备的肖特基势垒二极管(SBD)的微电子特性方面的潜在应用。通过分别将10 wt%的F8氯仿溶液和10:1 wt%的F8:CdSe QDs溶液旋涂在预先沉积在氧化铟锡(ITO)衬底上的聚(3 - 己基噻吩)(P3HT)上,制备了两个SBD,即Ag/F8/P3HT/ITO和Ag/F8 - CdSe QDs/P3HT/ITO。为了研究所制备器件的电学性质,在25°C的黑暗条件下进行电流 - 电压(I - V)测量。Ag/F8/P3HT/ITO和Ag/F8 - CdSe QDs/P3HT/ITO SBD的I - V曲线呈现不对称行为,在±3.5 V时正向偏置电流整流比(RR)分别为7.4±0.02和142±0.02,这证实了耗尽区的形成。从相应的I - V特性中提取了控制所制备器件微电子性质的其他关键参数,如载流子迁移率(µ)、势垒高度(ϕ)、串联电阻(R)和品质因数(n)。还应用诺德函数和张函数来表征器件,以研究各种参数的一致性。与Ag/F8/P3HT/ITO相比,Ag/F8 - CdSe QDs/P3HT/ITO SBD的R、n和RR值分别显著提高了3倍、1.7倍和19倍。这种增强归因于具有三维量子限制和大表面积与体积比的CdSe QDs的掺入。还讨论了两个器件的普尔 - 弗伦克尔和理查森 - 肖特基传导机制。还报道并讨论了CdSe QDs的形态、光学带隙(1.88±0.5 eV)和光致发光(PL)光谱,其峰值强度在556 nm处。