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通过侧壁转移金属辅助化学蚀刻制备超高纵横比(>420:1)的氧化铝纳米管阵列

Fabrication of Ultra-High Aspect Ratio (>420:1) AlO Nanotube Arraysby Sidewall TransferMetal Assistant Chemical Etching.

作者信息

Li Hailiang, Xie Changqing

机构信息

Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China.

出版信息

Micromachines (Basel). 2020 Apr 3;11(4):378. doi: 10.3390/mi11040378.

Abstract

We report a robust, sidewall transfer metal assistant chemical etching scheme for fabricating AlO nanotube arrays with an ultra-high aspect ratio. Electron beam lithography followed by low-temperature Au metal assisted chemical etching (MacEtch) is used to pattern high resolution, high aspect ratio, and vertical silicon nanostructures, used as a template. This template is subsequently transferred by an atomic layer deposition of the AlO layer, followed by an annealing process, anisotropic dry etching of the AlO layer, and a sacrificial silicon template. The process and characterization of the AlO nanotube arrays are discussed in detail. Vertical AlO nanotube arrays with line widths as small as 50 nm, heights of up to 21 μm, and aspect ratios up to 420:1 are fabricated on top of a silicon substrate. More importantly, such a sidewall transfer MacEtch approach is compatible with well-established silicon planar processes, and has the benefits of having a fully controllable linewidth and height, high reproducibility, and flexible design, making it attractive for a broad range of practical applications.

摘要

我们报道了一种用于制备具有超高纵横比的AlO纳米管阵列的稳健的侧壁转移金属辅助化学蚀刻方案。先采用电子束光刻,然后进行低温金金属辅助化学蚀刻(MacEtch),以制备用作模板的高分辨率、高纵横比的垂直硅纳米结构。随后通过AlO层的原子层沉积、退火工艺、AlO层的各向异性干法蚀刻以及牺牲硅模板来转移该模板。详细讨论了AlO纳米管阵列的工艺及表征。在硅衬底上制备出了线宽小至50 nm、高度高达21 μm且纵横比高达420:1的垂直AlO纳米管阵列。更重要的是,这种侧壁转移MacEtch方法与成熟的硅平面工艺兼容,具有线宽和高度完全可控、高重现性以及灵活设计等优点,使其在广泛的实际应用中具有吸引力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3a85/7230905/d856c4013571/micromachines-11-00378-g001.jpg

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