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聚合物薄膜的温度相关光谱椭偏测量法

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films.

作者信息

Hajduk Barbara, Bednarski Henryk, Trzebicka Barbara

机构信息

Centre of Polymer and Carbon Materials, Polish Academy of Sciences, M. Curie-Skłodowskiej 34, 41-819 Zabrze, Poland.

出版信息

J Phys Chem B. 2020 Apr 23;124(16):3229-3251. doi: 10.1021/acs.jpcb.9b11863. Epub 2020 Apr 10.

DOI:10.1021/acs.jpcb.9b11863
PMID:32275433
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7590969/
Abstract

Thin polymer films have found many important applications in organic electronics, such as active layers, protective layers, or antistatic layers. Among the various experimental methods suitable for studying the thermo-optical properties of thin polymer films, temperature-dependent spectroscopic ellipsometry plays a special role as a nondestructive and very sensitive optical technique. In this Review Article, issues related to the physical origin of the dependence of ellipsometric angles on temperature are surveyed. In addition, the Review Article discusses the use of temperature-dependent spectroscopic ellipsometry for studying phase transitions in thin polymer films. The benefits of studying thermal transitions using different cooling/heating speeds are also discussed. Furthermore, it is shown how the analysis and modeling of raw ellipsometric data can be used to determine the thermal properties of thin polymer films.

摘要

聚合物薄膜在有机电子学领域有许多重要应用，如作为有源层、保护层或抗静电层。在适用于研究聚合物薄膜热光特性的各种实验方法中，变温光谱椭偏测量法作为一种无损且非常灵敏的光学技术发挥着特殊作用。在这篇综述文章中，探讨了椭偏角随温度变化的物理起源相关问题。此外，该综述文章还讨论了如何利用变温光谱椭偏测量法研究聚合物薄膜中的相变。还讨论了采用不同冷却/加热速度研究热转变的益处。此外，展示了如何通过对原始椭偏数据的分析和建模来确定聚合物薄膜的热性能。

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