Silvestri Francesco, Prieto Mauricio J, Babuji Adara, Tănase Liviu C, de Souza Caldas Lucas, Solomeshch Olga, Schmidt Thomas, Ocal Carmen, Barrena Esther
Instituto de Ciencia de Materiales de Barcelona (ICMAB-CSIC), Bellaterra, 08193 Barcelona, Spain.
Department of Interface Science, Fritz-Haber Institute of the Max Planck Society, 14195 Berlin, Germany.
ACS Appl Mater Interfaces. 2020 Jun 3;12(22):25444-25452. doi: 10.1021/acsami.0c05583. Epub 2020 May 22.
Establishing the rather complex correlation between the structure and the charge transfer in organic-organic heterostructures is of utmost importance for organic electronics and requires spatially resolved structural, chemical, and electronic details. Insight into this issue is provided here by combining atomic force microscopy, Kelvin probe force microscopy, photoemission electron microscopy, and low-energy electron microscopy for investigating a case study. We select the interface formed by pentacene (PEN), benchmark among the donor organic semiconductors, and a p-type dopant from the family of fluorinated fullerenes. As for Buckminsterfullerene (C), the growth of its fluorinated derivative CF is influenced by the thickness and crystallinity of the PEN buffer layer, but the behavior is markedly different. We provide a microscopic description of the CF/PEN interface formation and analyze the consequences in the electronic properties of the final heterostructure. For just one single layer of PEN, a laterally complete but noncompact CF/PEN interface is created, importantly affecting the surface work function. Nonetheless, from the very beginning of the second layer formation, the presence of epitaxial and nonepitaxial PEN domains dramatically influences the growth dynamics and extremely well packed two-dimensional CF islands develop. Insightful elemental maps of the CF/PEN surface spatially resolve the nonuniform distribution of the dopant molecules, which leads to a heterogeneous work function landscape.
在有机-有机异质结构中建立结构与电荷转移之间相当复杂的关联对于有机电子学至关重要,并且需要空间分辨的结构、化学和电子细节。本文通过结合原子力显微镜、开尔文探针力显微镜、光发射电子显微镜和低能电子显微镜来研究一个案例,从而深入了解这个问题。我们选择并五苯(PEN,供体有机半导体中的基准材料)与一种来自氟化富勒烯家族的p型掺杂剂形成的界面。至于巴克敏斯特富勒烯(C),其氟化衍生物CF的生长受PEN缓冲层的厚度和结晶度影响,但行为明显不同。我们对CF/PEN界面形成进行了微观描述,并分析了其对最终异质结构电子性质的影响。对于仅一层PEN,会形成横向完整但不紧密的CF/PEN界面,这对表面功函数有重要影响。然而,从第二层形成之初,外延和非外延PEN域的存在就极大地影响了生长动力学,并且形成了排列极其紧密的二维CF岛。CF/PEN表面有洞察力的元素图在空间上解析了掺杂剂分子的不均匀分布,这导致了功函数的不均匀分布。