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解决单发射体定位显微镜中轴向距离测量的系统误差。

Addressing systematic errors in axial distance measurements in single-emitter localization microscopy.

作者信息

Petrov Petar N, Moerner W E

出版信息

Opt Express. 2020 Jun 22;28(13):18616-18632. doi: 10.1364/OE.391496.

Abstract

Nanoscale localization of point emitters is critical to several methods in optical fluorescence microscopy, including single-molecule super-resolution imaging and tracking. While the precision of the localization procedure has been the topic of extensive study, localization accuracy has been less emphasized, in part due to the challenge of producing an experimental sample containing unperturbed point emitters at known three-dimensional positions in a relevant geometry. We report a new experimental system which reproduces a widely-adopted geometry in high-numerical aperture localization microscopy, in which molecules are situated in an aqueous medium above a glass coverslip imaged with an oil-immersion objective. We demonstrate a calibration procedure that enables measurement of the depth-dependent point spread function (PSF) for open aperture imaging as well as imaging with engineered PSFs with index mismatch. We reveal the complicated, depth-varying behavior of the focal plane position in this system and discuss the axial localization biases incurred by common approximations of this behavior. We compare our results to theoretical calculations.

摘要

点发射器的纳米级定位对于光学荧光显微镜中的多种方法至关重要,包括单分子超分辨率成像和跟踪。虽然定位过程的精度一直是广泛研究的主题,但定位准确性却较少受到关注,部分原因是难以制备出在相关几何结构中处于已知三维位置且未受干扰的点发射器的实验样本。我们报告了一种新的实验系统,该系统再现了高数值孔径定位显微镜中广泛采用的几何结构,其中分子位于玻璃盖玻片上方的水性介质中,通过油浸物镜进行成像。我们展示了一种校准程序,该程序能够测量开孔成像以及具有折射率失配的工程化点扩散函数(PSF)成像时与深度相关的PSF。我们揭示了该系统中焦平面位置复杂的、随深度变化的行为,并讨论了对此行为的常见近似所导致的轴向定位偏差。我们将我们的结果与理论计算进行了比较。

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