Faculty of Engineering and Natural Sciences, Tampere University, Tampere, Finland.
Faculty of Information Technology and Communication Sciences, Tampere University, Korkeakoulunkatu 3, 33720, Tampere, Finland.
Sci Rep. 2020 Jul 21;10(1):12037. doi: 10.1038/s41598-020-68871-w.
Stretchable electronics promise to extend the application range of conventional electronics by enabling them to keep their electrical functionalities under system deformation. Within this framework, development of printable silver-polymer composite inks is making possible to realize several of the expected applications for stretchable electronics, which range from seamless sensors for human body measurement (e.g. health patches) to conformable injection moulded structural electronics. However, small rigid electric components are often incorporated in these devices to ensure functionality. Under mechanical loading, these rigid elements cause strain concentrations and a general deterioration of the system's electrical performance. This work focuses on different strategies to improve electromechanical performance by investigating the deformation behaviour of soft electronic systems comprising rigid devices through Finite Element analyses. Based on the deformation behaviour of a simple stretchable device under tensile loading, three general strategies were proposed: local component encapsulation, direct component shielding, and strain dispersion. The FE behaviour achieved using these strategies was then compared with the experimental results obtained for each design, highlighting the reasons for their different resistance build-up. Furthermore, crack formation in the conductive tracks was analysed under loading to highlight its link with the evolution of the system electrical performance.
可拉伸电子产品有望通过使传统电子产品在系统变形下保持其电气功能,从而扩展其应用范围。在这个框架内,可打印的银聚合物复合油墨的发展使得实现可拉伸电子产品的许多预期应用成为可能,这些应用从用于人体测量的无缝传感器(例如健康贴片)到符合人体结构的注塑成型结构电子产品。然而,在这些设备中通常会加入小型刚性电气元件以确保其功能。在机械负载下,这些刚性元件会导致应变集中和系统电气性能的普遍恶化。本工作通过有限元分析研究包含刚性器件的软电子系统的变形行为,重点关注通过不同策略来提高机电性能。基于拉伸加载下简单可拉伸器件的变形行为,提出了三种通用策略:局部元件封装、直接元件屏蔽和应变分散。然后将使用这些策略获得的 FE 行为与每个设计的实验结果进行比较,突出了它们不同的抗阻形成原因。此外,在加载下分析了导电轨道中的裂纹形成,以突出其与系统电气性能演变的关系。