Kim Jung Hwa, Kim Se-Yang, Park Sung O, Jung Gwan Yeong, Song Seunguk, Sohn Ahrum, Kim Sang-Woo, Kwak Sang Kyu, Kwon Soon-Yong, Lee Zonghoon
School of Materials Science and Engineering Ulsan National Institute of Science and Technology (UNIST) Ulsan 44919 Republic of Korea.
Center for Multidimensional Carbon Materials Institute for Basic Science (IBS) Ulsan 44919 Republic of Korea.
Adv Sci (Weinh). 2020 Jun 8;7(15):2000788. doi: 10.1002/advs.202000788. eCollection 2020 Aug.
Antiphase boundaries (APBs) in 2D transition metal dichalcogenides have attracted wide interest as 1D metallic wires embedded in a semiconducting matrix, which could be exploited in fully 2D-integrated circuits. Here, the anisotropic morphologies of APBs (i.e., linear and saw-toothed APBs) in the nanoscale are investigated. The experimental and computational results show that despite their anisotropic nanoscale morphologies, all APBs adopt a predominantly chalcogen-oriented dense structure to maintain the energetically most stable atomic configuration. Moreover, the effect of the nanoscale morphology of an APB on electron transport from two-probe field effect transistor measurements is investigated. A saw-toothed APB has a considerably lower electron mobility than a linear APB, indicating that kinks between facets are the main factors of scattering. The observations contribute to the systematical understanding of the faceted APBs and its impact on electrical transport behavior and it could potentially extend the applications of 2D materials through defect engineering to achieve the desired properties.
二维过渡金属二硫属化物中的反相边界(APB)作为嵌入半导体基质中的一维金属线引起了广泛关注,可用于全二维集成电路。在此,研究了纳米尺度下APB的各向异性形态(即线性和锯齿形APB)。实验和计算结果表明,尽管它们具有各向异性的纳米尺度形态,但所有APB都采用主要面向硫族元素的致密结构来维持能量上最稳定的原子构型。此外,还研究了APB的纳米尺度形态对两探针场效应晶体管测量中电子输运的影响。锯齿形APB的电子迁移率比线性APB低得多,这表明面之间的扭结是散射的主要因素。这些观察结果有助于系统地理解多面APB及其对电输运行为的影响,并且通过缺陷工程实现所需性能,它可能会扩展二维材料的应用。