Wang Hsiang-Chun, Hong Yuehua, Chen Zhangwei, Lao Changshi, Lu Youming, Yang Zhichao, Zhu Youhua, Liu Xinke
College of Materials Science and Engineering, Shenzhen University-Hanshan Normal University Post Doctoral Workstation, Shenzhen University, Shenzhen, 518060, China.
College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, China.
Nanoscale Res Lett. 2020 Sep 4;15(1):176. doi: 10.1186/s11671-020-03405-x.
To further improve the performance of all-inkjet-printing ZnO UV photodetector and maintain the advantages of inkjet printing technology, the inkjet printing Ag nanoparticles (NPs) were deposited on the inkjet printing ZnO UV photodetector for the first time. The inkjet printing Ag NPs can passivate the surface defects of ZnO and work as surface plasmons from the characterization of photoluminescence (PL), X-ray photoelectron spectroscopy (XPS), and finite difference time domain method (FDTD) simulation. The normalized detectivity (D) of the Ag NP-modified detector reaches to 1.45 × 10 Jones at 0.715 mW incident light power, which is higher than that of 5.72 × 10 Jones of the bare ZnO photodetector. The power-law relationship between the photocurrent and the incident light power of the Ag NP-modified ZnO detector is I ∝ P, which means the photocurrent is highly sensitive to the change of incident light power.
为进一步提高全喷墨打印氧化锌紫外光电探测器的性能并保持喷墨打印技术的优势，首次将喷墨打印的银纳米颗粒（NPs）沉积在喷墨打印的氧化锌紫外光电探测器上。从光致发光（PL）、X射线光电子能谱（XPS）和时域有限差分法（FDTD）模拟的表征结果来看，喷墨打印的银纳米颗粒可以钝化氧化锌的表面缺陷并作为表面等离子体起作用。在0.715 mW的入射光功率下，银纳米颗粒修饰的探测器的归一化探测率（D）达到1.45×10琼斯，高于未修饰的氧化锌光电探测器的5.72×10琼斯。银纳米颗粒修饰的氧化锌探测器的光电流与入射光功率之间的幂律关系为I ∝ P，这意味着光电流对入射光功率的变化高度敏感。
