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具有专利中心性测量和改进率估计的30个技术领域的功能性能改进数据和专利集。

Functional performance improvement data and patent sets for 30 technology domains with measurements of patent centrality and estimations of the improvement rate.

作者信息

Triulzi Giorgio, Magee Christopher L

机构信息

Universidad de los Andes, School of Management, Colombia; Massachusetts Institute of Technology, Institute for Data, Systems and Society, United States.

Massachusetts Institute of Technology, Institute for Data, Systems and Society and International Design Center, United States.

出版信息

Data Brief. 2020 Sep 2;32:106257. doi: 10.1016/j.dib.2020.106257. eCollection 2020 Oct.

Abstract

This article accompanies the study presented in Triulzi et al. (2020) [1]. It briefly describes and makes available the data on functional performance for 30 technology domains, their patent sets, the measurement of patent centrality and the method to estimate the yearly technology performance improvement rate (TIR) that underly that study. Some of this data (performance time series and the lists of patents for 28 domains) has been collected by other authors for previous studies but were previously unavailable to the public. Measurements of patent centrality and other patent-based indicators for the 30 domains, and for 5.259.906 utility patents granted by the United States Patent and Trademark Office between 1976 and 2015 are novel data contributed by Triulzi et al. (2020) [1]. Here we organize, describe and make available the collection of data in its entirety. This allows anyone interested to replicate the study or use the method to estimate the improvement rate of a given technology for which patents can be identified. For a detailed description of the data and methods see Triulzi et al. (2020) [1].

摘要

本文是对Triulzi等人(2020年)[1]所发表研究的补充。它简要描述并提供了关于30个技术领域的功能性能数据、其专利集、专利中心性的度量以及用于估计该研究中年度技术性能改进率(TIR)的方法。其中一些数据(性能时间序列和28个领域的专利列表)已被其他作者收集用于先前的研究,但此前未向公众公开。Triulzi等人(2020年)[1]贡献了关于这30个领域以及1976年至2015年间美国专利商标局授予的5259906项实用专利的专利中心性度量和其他基于专利的指标等新数据。在此,我们对这些数据进行整理、描述并完整呈现。这使得任何感兴趣的人都能够复制该研究或使用该方法来估计对于可识别专利的给定技术的改进率。有关数据和方法的详细描述,请参阅Triulzi等人(2020年)[1]。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e957/7490809/68de54db7603/gr1.jpg

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