Fast and accurate Monte Carlo simulations of subdiffusive spatially resolved reflectance for a realistic optical fiber probe tip model aided by a deep neural network.

In this work, we introduce a framework for efficient and accurate Monte Carlo (MC) simulations of spatially resolved reflectance (SRR) acquired by optical fiber probes that account for all the details of the probe tip including reflectivity of the stainless steel and the properties of the epoxy fill and optical fibers. While using full details of the probe tip is essential for accurate MC simulations of SRR, the break-down of the radial symmetry in the detection scheme leads to about two orders of magnitude longer simulation times. The introduced framework mitigates this performance degradation, by an efficient reflectance regression model that maps SRR obtained by fast MC simulations based on a simplified probe tip model to SRR simulated using the full details of the probe tip. We show that a small number of SRR samples is sufficient to determine the parameters of the regression model. Finally, we use the regression model to simulate SRR for a stainless steel optical probe with six linearly placed fibers and experimentally validate the framework through the use of inverse models for estimation of absorption and reduced scattering coefficients and subdiffusive scattering phase function quantifiers.