Heuke Sandro, Lombardini Alberto, Büttner Edlef, Rigneault Hervé
Opt Express. 2020 Sep 28;28(20):29619-29630. doi: 10.1364/OE.400298.
The fidelity of stimulated Raman scattering (SRS) microscopy images is impaired by artifacts such as thermal lensing, cross-phase modulation and multi-photon absorption. These artifacts affect differently the stimulated Raman loss (SRL) and stimulated Raman gain (SRG) channels making SRL and SRG image comparisons attractive to identify and correct SRS image artifacts. To provide answer to the question: "Can I trust my SRS images?", we designed a novel, but straightforward SRS scheme that enables the dectection of the stimulated Raman gain and loss (SRGAL) simultaneously at the same pixel level. As an advantage over the conventional SRS imaging scheme, SRGAL doubles the SRS signal by acquiring both SRL as well as SRG and allows for the identification of SRS artifacts and their reduction via a balanced summation of the SRL and SRG images.
受激拉曼散射(SRS)显微镜图像的保真度会受到热透镜效应、交叉相位调制和多光子吸收等伪像的影响。这些伪像对受激拉曼损耗(SRL)和受激拉曼增益(SRG)通道的影响不同,使得SRL和SRG图像比较有助于识别和校正SRS图像伪像。为了回答“我能信任我的SRS图像吗?”这个问题,我们设计了一种新颖但简单的SRS方案,该方案能够在同一像素水平上同时检测受激拉曼增益和损耗(SRGAL)。与传统的SRS成像方案相比,SRGAL通过同时获取SRL和SRG使SRS信号加倍,并允许通过SRL和SRG图像的平衡求和来识别SRS伪像并减少它们。