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表面化学对Si(100)、Ge(100)表面以及SiGe异质结构的功函数、电离势和电子亲和势的影响。

Surface chemistry effects on work function, ionization potential and electronic affinity of Si(100), Ge(100) surfaces and SiGe heterostructures.

作者信息

Marri Ivan, Amato Michele, Bertocchi Matteo, Ferretti Andrea, Varsano Daniele, Ossicini Stefano

机构信息

Department of Sciences and Methods for Engineering, University of Modena e Reggio Emilia, 42122 Reggio Emilia, Italy.

出版信息

Phys Chem Chem Phys. 2020 Nov 18;22(44):25593-25605. doi: 10.1039/d0cp04013d.

Abstract

We combine density functional theory and many body perturbation theory to investigate the electronic properties of Si(100) and Ge(100) surfaces terminated with halogen atoms (-I, -Br, -Cl, -F) and other chemical functionalizations (-H, -OH, -CH3) addressing the absolute values of their work function, electronic affinity and ionization potential. Our results point out that electronic properties of functionalized surfaces strongly depend on the chemisorbed species and much less on the surface crystal orientation. The presence of halogens at the surface always leads to an increment of the work function, ionization potential and electronic affinity with respect to fully hydrogenated surfaces. On the contrary, the presence of polar -OH and -CH3 groups at the surface leads to a reduction of the aforementioned quantities with respect to the H-terminated system. Starting from the work functions calculated for the Si and Ge passivated surfaces, we apply a simple model to estimate the properties of functionalized SiGe surfaces. The possibility of modulating the work function by changing the chemisorbed species and composition is predicted. The effects induced by different terminations on the band energy line-up profile of SiGe surfaces are then analyzed. Interestingly, our calculations predict a type-II band offset for the H-terminated systems and a type-I band offset for the other cases.

摘要

我们结合密度泛函理论和多体微扰理论,研究了以卤原子(-I、-Br、-Cl、-F)和其他化学官能团(-H、-OH、-CH3)终止的Si(100)和Ge(100)表面的电子性质,探讨了它们的功函数、电子亲和能和电离势的绝对值。我们的结果指出,功能化表面的电子性质强烈依赖于化学吸附物种,而对表面晶体取向的依赖程度则小得多。相对于完全氢化的表面,表面存在卤素总是导致功函数、电离势和电子亲和能增加。相反,相对于氢终止体系,表面存在极性-OH和-CH3基团会导致上述量的减少。从计算得到的Si和Ge钝化表面的功函数出发,我们应用一个简单模型来估计功能化SiGe表面的性质。预测了通过改变化学吸附物种和组成来调节功函数的可能性。然后分析了不同终止对SiGe表面能带能量排列轮廓的影响。有趣的是,我们的计算预测氢终止体系为II型能带偏移,其他情况为I型能带偏移。

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