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具有高运行性能的耐储存量子点发光二极管。

Shelf-Stable Quantum-Dot Light-Emitting Diodes with High Operational Performance.

作者信息

Chen Desui, Chen Dong, Dai Xingliang, Zhang Zhenxing, Lin Jian, Deng Yunzhou, Hao Yanlei, Zhang Ci, Zhu Haiming, Gao Feng, Jin Yizheng

机构信息

Centre for Chemistry of High-Performance & Novel Materials, State Key Laboratory of Silicon Materials, Department of Chemistry, Zhejiang University, Hangzhou, 310027, China.

Centre for Chemistry of High-Performance & Novel Materials, Department of Chemistry, Zhejiang University, Hangzhou, 310027, China.

出版信息

Adv Mater. 2020 Dec;32(52):e2006178. doi: 10.1002/adma.202006178. Epub 2020 Nov 16.

Abstract

Quantum-dot light-emitting diodes (QLEDs) promise a new generation of high-performance, large-area, and cost-effective electroluminescent devices for both display and solid-state lighting technologies. However, a positive ageing process is generally required to improve device performance for state-of-the-art QLEDs. Here, it is revealed that the in situ reactions induced by organic acids in the commonly used encapsulation acrylic resin lead to positive ageing and, most importantly, the progression of in situ reactions inevitably results in negative ageing, i.e., deterioration of device performance after long-term shelf storage. In-depth mechanism studies focusing on the correlations between the in situ chemical reactions and the shelf-ageing behaviors of QLEDs inspire the design of an electron-transporting bilayer, which delivers both improved electrical conductivity and suppressed interfacial exciton quenching. This material innovation enables red QLEDs exhibiting neglectable changes of external quantum efficiency (>20.0%) and ultralong operational lifetime (T : 5500 h at 1000 nits) after storage for 180 days. This work provides design principles for oxide electron-transporting layers to realize shelf-stable and high-operational-performance QLEDs, representing a new starting point for both fundamental studies and practical applications.

摘要

量子点发光二极管(QLED)有望为显示和固态照明技术带来新一代高性能、大面积且经济高效的电致发光器件。然而,对于最先进的QLED而言,通常需要一个正向老化过程来提高器件性能。在此,研究表明常用封装丙烯酸树脂中有机酸引发的原位反应会导致正向老化,并且最重要的是,原位反应的进行不可避免地会导致负向老化,即在长期储存后器件性能恶化。针对原位化学反应与QLED储存老化行为之间相关性的深入机理研究激发了一种电子传输双层结构的设计,该结构兼具提高的电导率和抑制的界面激子猝灭。这种材料创新使得红色QLED在储存180天后,其外量子效率变化可忽略不计(>20.0%)且具有超长的工作寿命(在1000尼特下T:5500小时)。这项工作为氧化物电子传输层提供了设计原则,以实现具有储存稳定性和高工作性能的QLED,代表了基础研究和实际应用的一个新起点。

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