Zhang Chenshuang, Zhang Wei, Yu Bin, Danying Lin, Qu Junle
Opt Express. 2020 Dec 7;28(25):37946-37957. doi: 10.1364/OE.412489.
Multifocal structured illumination microscopy (MSIM) can rapidly retrieve 3D structures of thick samples by using multi-spot excitation and detection. Although numerous super-resolution (SR) and optical sectioning (OS) methods have been introduced in this field, the existing OS-SR method in MSIM still has the difficulty in rejecting deep defocused light, which may lead to strong background signal in the retrieved results. To this end, an enhanced OS-SR method is proposed to simultaneously achieve the desired OS capability and significant resolution improvement in MSIM. The enhanced OS-SR image is obtained by combining the standard deviation image with the conventional OS-SR image in the frequency domain. The validity of the proposed method is demonstrated by simulation and experimental results.
多焦点结构照明显微镜（MSIM）可以通过多光斑激发和检测快速获取厚样品的三维结构。尽管该领域已经引入了众多超分辨率（SR）和光学切片（OS）方法，但MSIM中现有的OS-SR方法在抑制深度散焦光方面仍存在困难，这可能导致检索结果中出现强烈的背景信号。为此，提出了一种增强型OS-SR方法，以在MSIM中同时实现所需的OS能力和显著的分辨率提升。通过在频域中将标准差图像与传统的OS-SR图像相结合来获得增强型OS-SR图像。仿真和实验结果证明了该方法的有效性。
