Ruebeling F, Xu Y, Richter G, Dini D, Gumbsch P, Greiner C
Institute for Applied Materials (IAM), Karlsruhe Institute of Technology (KIT), Kaiserstrasse 12, 76131 Karlsruhe, Germany.
KIT IAM-CMS MicroTribology Center (μTC), Strasse Am Forum 5, 76131 Karlsruhe, Germany.
ACS Appl Mater Interfaces. 2021 Jan 27;13(3):4750-4760. doi: 10.1021/acsami.0c19736. Epub 2021 Jan 14.
Near the interface of two contacting metallic bodies in relative motion, the microstructure changes. This modified microstructure leads to changes in material properties and thereby influences the tribological behavior of the entire contact. Tribological properties such as the friction coefficient and wear rate are controlled by the microstructure, while the elementary mechanisms for microstructural changes are not sufficiently understood. In this paper, the influence of the normal load and the size of the counter body on the initiation of a tribologically induced microstructure in copper after a single sliding pass is revealed. A systematic variation in the normal load and sphere diameter resulted in maximum Hertzian contact pressures between 530 MPa and 1953 MPa. Scanning electron microscopy, focused ion beam, and transmission electron microscopy were used to probe the subsurface deformation. Irrespective of the normal load and the sphere diameter, a sharp line-like feature consisting of dislocations, the so-called dislocation trace line, was identified in the subsurface area at depths between 100 nm and 400 nm. For normal loads below 6.75 N, dislocation features are formed below this line. For higher normal loads, the microstructure evolution directly underneath the surface is mainly confined to the area between the sample surface and the dislocation trace line, which itself is located at increasing depth. Transmission Kikuchi diffraction and transmission electron microscopy demonstrate that the misorientation is predominantly concentrated at the dislocation trace line. The results disclose a material rotation around axes roughly parallel to the transverse direction. This study demonstrates the generality of the trace line phenomena over a wide range of loads and contact pressures and the complexity of subsurface processes under a sliding contact and provides the basis for modeling the early stages in the microstructure evolution.
在两个相对运动的接触金属体的界面附近,微观结构会发生变化。这种改变后的微观结构会导致材料性能发生变化,从而影响整个接触区域的摩擦学行为。诸如摩擦系数和磨损率等摩擦学性能由微观结构控制,而微观结构变化的基本机制尚未得到充分理解。本文揭示了法向载荷和对磨体尺寸对铜在单次滑动后摩擦学诱导微观结构起始的影响。法向载荷和球体直径的系统变化导致最大赫兹接触压力在530兆帕至1953兆帕之间。使用扫描电子显微镜、聚焦离子束和透射电子显微镜来探测亚表面变形。无论法向载荷和球体直径如何,在深度为100纳米至400纳米的亚表面区域都发现了一条由位错组成的尖锐线状特征,即所谓的位错迹线。对于低于6.75牛的法向载荷,位错特征在这条线以下形成。对于更高的法向载荷,表面正下方的微观结构演变主要局限于样品表面和位错迹线之间的区域,而位错迹线本身位于不断增加的深度处。透射菊池衍射和透射电子显微镜表明,取向差主要集中在位错迹线处。结果揭示了材料围绕大致平行于横向方向的轴的旋转。这项研究证明了迹线现象在广泛的载荷和接触压力范围内的普遍性以及滑动接触下亚表面过程的复杂性,并为微观结构演变早期阶段的建模提供了基础。