Hartley P, Egdell R G, Zhang K H L, Hohmann M V, Piper L F J, Morgan D J, Scanlon D O, Williamson B A D, Regoutz A
Department of Chemistry, Inorganic Chemistry Laboratory, University of Oxford, South Parks Road, Oxford OX1 3QR, U.K.
State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, People's Republic of China.
J Phys Chem C Nanomater Interfaces. 2021 Mar 25;125(11):6387-6400. doi: 10.1021/acs.jpcc.0c11592. Epub 2021 Mar 11.
Ternary lanthanide indium oxides LnInO (Ln = La, Pr, Nd, Sm) were synthesized by high-temperature solid-state reaction and characterized by X-ray powder diffraction. Rietveld refinement of the powder patterns showed the LnInO materials to be orthorhombic perovskites belonging to the space group , based on almost-regular InO octahedra and highly distorted LnO polyhedra. Experimental structural data were compared with results from density functional theory (DFT) calculations employing a hybrid Hamiltonian. Valence region X-ray photoelectron and K-shell X-ray emission and absorption spectra of the LnInO compounds were simulated with the aid of the DFT calculations. Photoionization of lanthanide 4f orbitals gives rise to a complex final-state multiplet structure in the valence region for the 4f compounds PrInO, NdInO, and SmInO, and the overall photoemission spectral profiles were shown to be a superposition of final-state 4f terms onto the cross-section weighted partial densities of states from the other orbitals. The occupied 4f states are stabilized in moving across the series Pr-Nd-Sm. Band gaps were measured using diffuse reflectance spectroscopy. These results demonstrated that the band gap of LaInO is 4.32 eV, in agreement with DFT calculations. This is significantly larger than a band gap of 2.2 eV first proposed in 1967 and based on the idea that In 4d states lie above the top of the O 2p valence band. However, both DFT and X-ray spectroscopy show that In 4d is a shallow core level located well below the bottom of the valence band. Band gaps greater than 4 eV were observed for NdInO and SmInO, but a lower gap of 3.6 eV for PrInO was shown to arise from the occupied Pr 4f states lying above the main O 2p valence band.
通过高温固态反应合成了三元镧系铟氧化物LnInO(Ln = La、Pr、Nd、Sm),并通过X射线粉末衍射对其进行了表征。粉末图谱的Rietveld精修表明,基于几乎规则的InO八面体和高度扭曲的LnO多面体,LnInO材料为属于空间群的正交钙钛矿。将实验结构数据与采用杂化哈密顿量的密度泛函理论(DFT)计算结果进行了比较。借助DFT计算模拟了LnInO化合物的价区X射线光电子能谱以及K壳层X射线发射和吸收光谱。镧系4f轨道的光电离在4f化合物PrInO、NdInO和SmInO的价区产生了复杂的终态多重结构,并且总的光发射光谱轮廓显示为终态4f项叠加在来自其他轨道的截面加权态密度部分上。占据的4f态在Pr - Nd - Sm系列中移动时是稳定的。使用漫反射光谱法测量了带隙。这些结果表明,LaInO的带隙为4.32 eV,与DFT计算结果一致。这明显大于1967年首次提出的基于In 4d态位于O 2p价带顶部上方这一观点的2.2 eV带隙。然而,DFT和X射线光谱都表明In 4d是一个浅芯能级,位于价带底部下方。观察到NdInO和SmInO的带隙大于4 eV,但PrInO的较低带隙为3.6 eV,这是由于占据的Pr 4f态位于主要的O 2p价带上方。