Haldar Aparna, Tekieh Farideh, Balcerzak Margaret, Wolfe Danielle, Lim DaEun, Joustra Kelsey, Konkin David, Han Fangpu, Fedak George, Ouellet Thérèse
Ottawa Research and Development Centre, Agriculture and Agri-Food Canada, Ottawa, ON K1A 0C6, Canada.
Department of Biology, University of Ottawa, Ottawa, ON K1N 6N5, Canada.
Genome. 2021 Nov;64(11):1009-1020. doi: 10.1139/gen-2020-0152. Epub 2021 Apr 26.
The tall wheatgrass species carries on the long arm of chromosome 7E, a locus that contributes strongly to resistance to fusarium head blight (FHB), a devastating fungal disease affecting wheat crops in all temperate areas of the world. Introgression of 7E chromatin into chromosome 7D of wheat was induced by the mutant of CS. Recombinants between chromosome 7E and wheat chromosome 7D, induced by the mutation, were monitored by a combination of molecular markers and phenotyping for FHB resistance. Progeny of up to five subsequent generations derived from two lineages, 64-8 and 32-5, were phenotyped for FHB symptoms and genotyped using published and novel 7D- and 7E-specific markers. Fragments from the distal end of 7EL, still carrying FHB resistance and estimated to be less than 114 and 66 Mbp, were identified as introgressed into wheat chromosome arm 7DL of progeny derived from 64-8 and 32-5, respectively. Gene expression analysis revealed variation in the expression levels of genes from the distal ends of 7EL and 7DL in the introgressed progeny. The 7EL introgressed material will facilitate the use of the 7EL FHB resistance locus in wheat breeding programs.
高冰草物种的抗赤霉病基因位于7E染色体长臂上，该位点对赤霉病（FHB）抗性有很强的贡献，赤霉病是一种影响世界所有温带地区小麦作物的毁灭性真菌病害。通过中国春（CS）突变体诱导将7E染色质渗入小麦7D染色体。通过分子标记和赤霉病抗性表型分析相结合的方法，监测由该突变诱导的7E染色体与小麦7D染色体之间的重组体。对来自两个株系64 - 8和32 - 5的多达五代后代进行赤霉病症状表型分析，并使用已发表的和新的7D和7E特异性标记进行基因分型。分别在来自64 - 8和32 - 5的后代的小麦染色体臂7DL中鉴定出仍携带赤霉病抗性且估计小于114和66 Mbp的7EL远端片段。基因表达分析揭示了渗入后代中7EL和7DL远端基因表达水平的差异。7EL渗入材料将有助于在小麦育种计划中利用7EL赤霉病抗性位点。
