Deng Shaojia, Zhang Xin, Xiao Guowei David, Zhang Kai, He Xiaowu, Xin Shihan, Liu Xinlu, Zhong Anhui, Chai Yang
State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment, School of Electromechanical Engineering, Guangdong University of Technology, Guangzhou 510006, People's Republic of China.
APT Electronics Co., Ltd, 33 South of Huan Shi Road, Guangzhou 511458, People's Republic of China.
Nanotechnology. 2021 May 14;32(31). doi: 10.1088/1361-6528/abfc71.
Sintered nano-copper is becoming a promising candidate as thermal interface material (TIM) for die attaching in high power electronics. It exhibits much higher thermal conductivity and operating temperature than conventional TIMs based on polymer and solder joints, and higher electromigration resistance and lower cost than sintered nano-silver TIM. However, the performance of existing sintered nano-copper is lower than expected because of high porosity resulted from poor sintering of copper particles with oxide shell. Here we demonstrate a method of improving the thermal conductivity of sintered copper by addition of graphene/Cu-CuO with controllable diameter of ∼163 nm. The measured thermal conductivity of the sintered composite TIM is enhanced by up to 123.5% compared with that of sintered pure copper. It can be understood as a result of the formation of graphene heat transfer network in sintered TIM. In addition, the C-O-Cu bonds formed at the interface between graphene and copper nanoparticles are critical for improving thermal performance as well as electrical and mechanical performance of the TIM. The developed TIM can be widely used in high power electronic packaging especially for high temperature applications, including IGBT, SiC and GaN power devices.
烧结纳米铜正成为一种很有前景的热界面材料(TIM),用于高功率电子器件的芯片附着。与基于聚合物和焊点的传统TIM相比,它具有更高的热导率和工作温度,并且与烧结纳米银TIM相比,具有更高的抗电迁移性和更低的成本。然而,由于带有氧化壳的铜颗粒烧结不良导致孔隙率高,现有烧结纳米铜的性能低于预期。在此,我们展示了一种通过添加直径约为163nm且可控的石墨烯/Cu-CuO来提高烧结铜热导率的方法。与烧结纯铜相比,所测量的烧结复合TIM的热导率提高了高达123.5%。这可以理解为是在烧结TIM中形成石墨烯传热网络的结果。此外,在石墨烯与铜纳米颗粒之间的界面处形成的C-O-Cu键对于改善TIM的热性能以及电气和机械性能至关重要。所开发的TIM可广泛应用于高功率电子封装,特别是对于高温应用,包括IGBT、SiC和GaN功率器件。