Mamyrbayev Talgat, Ikematsu Katsumasa, Takano Hidekazu, Wu Yanlin, Kimura Kenji, Doll Patrick, Last Arndt, Momose Atsushi, Meyer Pascal
Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Baden-Württemberg, Germany.
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan.
J Synchrotron Radiat. 2021 May 1;28(Pt 3):732-740. doi: 10.1107/S1600577521001521. Epub 2021 Mar 12.
Owing to the development of X-ray focusing optics during the past decades, synchrotron-based X-ray microscopy techniques allow the study of specimens with unprecedented spatial resolution, down to 10 nm, using soft and medium X-ray photon energies, though at the expense of the field of view (FOV). One of the approaches to increase the FOV to square millimetres is raster-scanning of the specimen using a single nanoprobe; however, this results in a long data acquisition time. This work employs an array of inclined biconcave parabolic refractive multi-lenses (RMLs), fabricated by deep X-ray lithography and electroplating to generate a large number of long X-ray foci. Since the FOV is limited by the pattern height if a single RML is used by impinging X-rays parallel to the substrate, many RMLs at regular intervals in the orthogonal direction were fabricated by tilted exposure. By inclining the substrate correspondingly to the tilted exposure, 378000 X-ray line foci were generated with a length in the centimetre range and constant intervals in the sub-micrometre range. The capability of this new X-ray focusing device was first confirmed using ray-tracing simulations and then using synchrotron radiation at BL20B2 of SPring-8, Japan. Taking account of the fact that the refractive lens is effective for focusing high-energy X-rays, the experiment was performed with 35 keV X-rays. Next, by scanning a specimen through the line foci, this device was used to perform large FOV pixel super-resolution scanning transmission hard X-ray microscopy (PSR-STHXM) with a 780 ± 40 nm spatial resolution within an FOV of 1.64 cm × 1.64 cm (limited by the detector area) and a total scanning time of 4 min. Biomedical implant abutments fabricated via selective laser melting using Ti-6Al-4V medical alloy were measured by PSR-STHXM, suggesting its unique potential for studying extended and thick specimens. Although the super-resolution function was realized in one dimension in this study, it can be expanded to two dimensions by aligning a pair of presented devices orthogonally.
由于过去几十年中X射线聚焦光学技术的发展,基于同步加速器的X射线显微镜技术能够使用软X射线和中能X射线光子能量,以前所未有的空间分辨率(低至10纳米)研究样本,尽管代价是牺牲了视野(FOV)。将视野扩大到平方毫米的方法之一是使用单个纳米探针进行样本的光栅扫描;然而,这会导致数据采集时间很长。这项工作采用了一系列倾斜的双凹抛物面折射多透镜(RML),通过深度X射线光刻和电镀制造,以产生大量长X射线焦点。由于如果通过平行于基板入射X射线来使用单个RML,视野会受到图案高度的限制,因此通过倾斜曝光在正交方向上以规则间隔制造了许多RML。通过相应地倾斜基板以适应倾斜曝光,产生了378000个X射线线焦点,其长度在厘米范围内,间隔在亚微米范围内恒定。首先使用光线追踪模拟,然后使用日本SPring-8的BL20B2处的同步辐射,证实了这种新型X射线聚焦装置的能力。考虑到折射透镜对聚焦高能X射线有效这一事实,实验使用35 keV的X射线进行。接下来,通过使样本在线焦点中扫描,该装置用于在1.64 cm×1.64 cm的视野(受探测器面积限制)内以780±40纳米的空间分辨率进行大视野像素超分辨率扫描透射硬X射线显微镜(PSR-STHXM),总扫描时间为4分钟。通过使用Ti-6Al-4V医用合金通过选择性激光熔化制造的生物医学植入基台通过PSR-STHXM进行了测量,表明其在研究扩展和厚实样本方面具有独特潜力。尽管在本研究中在一维上实现了超分辨率功能,但通过将一对所示装置正交排列可以将其扩展到二维。