Ziniuk Roman, Yakovliev Artem, Li Hui, Chen Guanying, Qu Junle, Ohulchanskyy Tymish Y
Key Laboratory of Optoelectronic Devices and Systems, Center for Biomedical Photonics and College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China.
School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, China.
Front Chem. 2021 Apr 26;9:659553. doi: 10.3389/fchem.2021.659553. eCollection 2021.
Rare-earth doped nanoparticles (RENPs) have been widely used for anti-counterfeiting and security applications due to their light frequency conversion features: they are excited at one wavelength, and they display spectrally narrow and distinguished luminescence peaks either at shorter wavelengths (i.e., frequency/energy upconversion) or at longer wavelengths (frequency/energy downconversion). RENPs with a downconversion (DC) photoluminescence (PL) in short-wave infrared (SWIR) spectral range (~1,000-1,700 nm) have recently been introduced to anti-counterfeiting applications, allowing for multilevel protection based on PL imaging through opaque layers, due to a lesser scattering of SWIR PL emission. However, as the number and spectral positions of the discrete PL bands exhibited by rare-earth ions are well-known, it is feasible to replicate luminescence spectra from RENPs, which results in a limited anti-counterfeiting security. Alternatively, lifetime of PL from RENPs can be used for encoding, as it can be finely tuned in broad temporal range (i.e., from microseconds to milliseconds) by varying type of dopants and their content in RENPs, along with the nanoparticle morphology and size. Nevertheless, the current approach to decoding and imaging the RENP luminescence lifetimes requires multiple steps and is highly time-consuming, precluding practical applications of PL lifetime encoding for anti-counterfeiting. Herein, we report the use of a rapid lifetime determination (RLD) technique to overcome this issue and introduce real-time imaging of SWIR PL lifetime for anti-counterfeiting applications. NaYF:20% Yb, x% Er (x = 0, 2, 20, 80)@NaYF core@shell RENPs were synthesized and characterized, revealing DC PL in SWIR region, with maximum at ~1,530 nm and PL lifetimes ranging from 3.2 to 6 ms. Imaging of the nanoparticles with different lifetimes was performed by the developed time-gated imaging system engaging RLD method and the precise manipulation of the delay between the excitation pulses and camera gating windows. Moreover, it is shown that imaging and decrypting can be performed at a high rate (3-4 fps) in a cyclic manner, thus allowing for real-time temporal decoding. We believe that the demonstrated RLD-based fast PL lifetime imaging approach can be employed in other applications of photoluminescent RENPs.
稀土掺杂纳米颗粒(RENPs)因其光频率转换特性而被广泛应用于防伪和安全领域:它们在一个波长处被激发,并在较短波长(即频率/能量上转换)或较长波长(频率/能量下转换)处显示出光谱窄且独特的发光峰。最近,具有短波红外(SWIR)光谱范围(1000 - 1700 nm)下转换(DC)光致发光(PL)的RENPs已被引入防伪应用中,由于SWIR PL发射的散射较小,可通过不透明层基于PL成像实现多级保护。然而,由于稀土离子所表现出的离散PL带的数量和光谱位置是已知的,因此复制RENPs的发光光谱是可行的,这导致防伪安全性有限。另外,RENPs的PL寿命可用于编码,因为通过改变掺杂剂的类型及其在RENPs中的含量,以及纳米颗粒的形态和尺寸,可以在很宽的时间范围内(即从微秒到毫秒)对其进行精细调整。尽管如此,目前解码和成像RENPs发光寿命的方法需要多个步骤且非常耗时,这排除了PL寿命编码在防伪中的实际应用。在此,我们报告使用快速寿命测定(RLD)技术来克服这个问题,并引入用于防伪应用的SWIR PL寿命实时成像。合成并表征了NaYF:20% Yb, x% Er(x = 0, 2, 20, 80)@NaYF核壳RENPs,揭示了其在SWIR区域的DC PL,最大值在1530 nm处,PL寿命范围为3.2至6 ms。通过采用RLD方法的已开发时间选通成像系统以及精确控制激发脉冲和相机选通窗口之间的延迟,对具有不同寿命的纳米颗粒进行成像。此外,结果表明成像和解密可以以循环方式高速(3 - 4帧/秒)进行,从而实现实时时间解码。我们相信,所展示的基于RLD的快速PL寿命成像方法可用于光致发光RENPs的其他应用。