Peng Fan, Zhang Yongsheng, Li Wei, Miao Hong, Zeng Yi
The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China.
J Microsc. 2021 Sep;283(3):192-201. doi: 10.1111/jmi.13018. Epub 2021 May 28.
Symmetry analysis of the Kikuchi pattern is helpful to determine the crystal structure, and can significantly reduce the screening range of phase identification, thereby improving the accuracy and reliability of phase identification in electron backscatter diffraction (EBSD). Accurately identifying the symmetry axis from the Kikuchi pattern is the primary task of symmetry analysis. In this study, a new method was proposed to identify symmetry axes in Kikuchi patterns with the aid of reciprocal vectors. Taking the Kikuchi patterns of single-crystal silicon as a typical example, a method for drawing reciprocal vectors after strict projection correction is introduced. The complex task of identifying the symmetry axis is transformed into an intuitive judgment of the geometric relationship between reciprocal vectors, thus greatly simplifying the process. This method successfully elucidated information on six Kikuchi poles in three single-crystal silicon Kikuchi patterns, including 3-fold axes, 4-fold axes and asymmetric axes. The method can also distinguish between a 3-fold axis and an analogous 3-fold axis despite their only slight differences.
菊池花样的对称性分析有助于确定晶体结构，并且能够显著缩小相鉴定的筛选范围，从而提高电子背散射衍射（EBSD）中相鉴定的准确性和可靠性。从菊池花样中准确识别对称轴是对称性分析的首要任务。在本研究中，提出了一种借助倒易矢量识别菊池花样中对称轴的新方法。以单晶硅的菊池花样为典型示例，介绍了一种在严格投影校正后绘制倒易矢量的方法。将识别对称轴这一复杂任务转化为对倒易矢量之间几何关系的直观判断，从而大大简化了过程。该方法成功解析了三个单晶硅菊池花样中六个菊池极的信息，包括三重轴、四重轴和非对称轴。该方法还能够区分三重轴和类似的三重轴，尽管它们之间差异微小。
