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基于脉冲激光沉积的CsCuI薄膜/n-Si异质结的深紫外光电探测器。

Deep-ultraviolet photodetector based on pulsed-laser-deposited CsCuI films/n-Si heterojunction.

作者信息

Li Xiaoxuan, Zhang Lichun, Zhou Xiaoyu, Wang Cheng, Zhou Zhiying, He Shunli, Tian Dan, Ren Zhichao, Yang Chuanlu, Zhao Fengzhou

出版信息

Opt Lett. 2021 Sep 1;46(17):4252-4255. doi: 10.1364/OL.432497.

Abstract

All-inorganic lead-free perovskite thin films were prepared using pulsed laser deposition. Effects of the substrate temperature, laser energy, and laser frequency on the film structure and optoelectronic properties were studied. A heterojunction photodetector based on /- was constructed, and the deep-ultraviolet photoresponse was obtained. A high / ratio of 130 was achieved at -1.3, and the peak response of the heterojunction photodetector was 70.8 mA/W (280 nm), with the corresponding specific detectivity of 9.44×10⋅⋅. Moreover, the device showed good stability after being exposed to air for 30 days.

摘要

采用脉冲激光沉积法制备了全无机无铅钙钛矿薄膜。研究了衬底温度、激光能量和激光频率对薄膜结构和光电性能的影响。构建了基于/-的异质结光电探测器,并获得了深紫外光响应。在-1.3时实现了130的高/比,异质结光电探测器的峰值响应为70.8 mA/W(280 nm),相应的比探测率为9.44×10⋅⋅。此外,该器件在暴露于空气中30天后仍表现出良好的稳定性。

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