Huang Yu, Zhang Lichun, Wang Jianbu, Zhang Baoyu, Xin Lianjie, Niu Songren, Zhao Yuan, Xu Man, Chu Xinbo, Zhang Dengying, Qu Chong, Zhao FengZhou
Opt Lett. 2019 Apr 15;44(8):1908-1911. doi: 10.1364/OL.44.001908.
All-inorganic perovskite CsPbBr thin films have been prepared on Si (100) substrate by a pulsed-laser deposition (PLD) technique, and the morphology, structure, absorbance, and photoluminescence properties of CsPbBr thin films are investigated. A photodetector based on CsPbBr/n-Si heterojunction has been fabricated, and the performances of the device are characterized. The heterojunction photodetector exhibits diode-like rectifying behavior, and the photocurrent-to-dark-current ratio and peak responsivity of the heterojunction are approximately 168.5 and 0.6 A/W (-5 V, 520 nm), respectively. Furthermore, the CsPbBr/n-Si heterojunction photodetector exhibits fast response and recovery times. With good optoelectronic properties, CsPbBr thin films prepared by PLD should be widely applicable to high-performance photodetectors and other optoelectronic devices.
采用脉冲激光沉积(PLD)技术在Si(100)衬底上制备了全无机钙钛矿CsPbBr薄膜,并对CsPbBr薄膜的形貌、结构、吸光度和光致发光特性进行了研究。制备了基于CsPbBr/n-Si异质结的光电探测器,并对该器件的性能进行了表征。该异质结光电探测器表现出类似二极管的整流行为,异质结的光电流与暗电流之比和峰值响应率分别约为168.5和0.6 A/W(-5 V,520 nm)。此外,CsPbBr/n-Si异质结光电探测器具有快速的响应和恢复时间。通过PLD制备的CsPbBr薄膜具有良好的光电特性,应广泛应用于高性能光电探测器和其他光电器件。