Wang Yuehui, Li Haoran, Cao Jia, Shen Jiaying, Zhang Qingyi, Yang Yongtao, Dong Zhengang, Zhou Tianhong, Zhang Yang, Tang Weihua, Wu Zhenping
State Key Laboratory of Information Photonics and Optical Communications, and School of Science, Beijing University of Posts and Telecommunications, Beijing 100876, P.R. China.
Beijing Institute of Radio Measurement, Beijing 100039, P.R. China.
ACS Nano. 2021 Oct 26;15(10):16654-16663. doi: 10.1021/acsnano.1c06567. Epub 2021 Oct 4.
Solar blind photodetectors with a cutoff wavelength within the 200-280 nm region is attracting much attention due to their potential civilian and military applications. The avalanche photodetectors (APDs) formed based on wide-bandgap semiconductor GaO are expected to meet emerging technological demands. These devices, however, suffer from limitations associated with the quality of as-grown GaO or the difficulty in alleviating the defects and dislocations. Herein, high-performance APDs incorporating amorphous GaO (a-GaO)/ITO heterojunction as the central element have been reliably fabricated at room temperature. The a-GaO-based APDs exhibits an ultrahigh responsivity of 5.9 × 10 A/W, specific detectivity of 1.8 × 10 Jones, and an external quantum efficiency up to 2.9 × 10% under 254 nm light irradiation at 40 V reverse bias. Notably, the gain could reach 6.8 × 10, indicating the outstanding capability for ultraweak signals detection. The comprehensive superior capabilities of the a-GaO-based APDs can be ascribed to the intrinsic carrier transport manners in a-GaO as well as the modified band alignment at the heterojunctions. The trade-off between low processing temperature and superior characteristics of a-GaO promises greater design freedom for realization of wide applications of emerging semiconductor GaO with even better performance since relieving the burden on the integration progress.
截止波长在200 - 280纳米区域内的日盲光电探测器因其潜在的民用和军事应用而备受关注。基于宽带隙半导体GaO形成的雪崩光电探测器(APD)有望满足新兴的技术需求。然而,这些器件存在与生长态GaO的质量相关的局限性,或者在减轻缺陷和位错方面存在困难。在此,已在室温下可靠地制造出以非晶GaO(a - GaO)/ITO异质结为核心元件的高性能APD。基于a - GaO的APD在40 V反向偏压下,在254 nm光照射下表现出5.9×10 A/W的超高响应度、1.8×10琼斯的比探测率以及高达2.9×10%的外量子效率。值得注意的是,增益可达6.8×10,表明其具有出色的超弱信号检测能力。基于a - GaO的APD的综合优异性能可归因于a - GaO中的本征载流子传输方式以及异质结处的能带排列改性。低加工温度与a - GaO优异特性之间的权衡为实现具有更好性能的新兴半导体GaO的广泛应用带来了更大的设计自由度,因为减轻了集成过程的负担。