Kim Byungsoo, Kim Jae Young, Yang Duyoung, Park Sung Hyuk, Ryu Jung-El, Lee Yoon Jung, Kim Hyuk Jin, Bae Joonyup, Kim Jihyun, Park Yongjo, Jang Ho Won
Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea.
Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, Virginia 22904, United States.
ACS Nano. 2025 Jul 1;19(25):22870-22881. doi: 10.1021/acsnano.5c01454. Epub 2025 Jun 16.
High efficiency of charge carrier conduction is crucial for photoelectrical performance in ultraviolet C (UVC) photodetectors (PDs) based on heteroepitaxial beta-gallium oxide (β-GaO) thin films. However, the presence of in-plane rotational domains due to anisotropic symmetry severely degraded the efficiency of charge carrier conduction by trapping and recombination of carriers in conventional lateral PD (LPD). Here, we demonstrate an approach that enables vertical conduction configuration while preserving the high crystallinity of epitaxial Si-doped β-GaO (Si:GaO) through the epilayer transfer using a hole pattern sapphire nanomembrane (HPSN) growth template. Based on the characterization of domain orientation and photoresponsivity in transferred epitaxial Si:GaO membranes, we reveal the defect-related anisotropic conduction arising from the vertical interdomain and lateral intradomain conduction. Compared to the indirect intradomain pathway in LPD, the vertical PD (VPD) exhibited high efficiency of charge carrier conduction through the direct interdomain pathways. As a result, the self-powered VPD exhibits high rectifying characteristics with a high detectivity of 1.02 × 10 Jones and a fast response time of 93 ms. Moreover, the multipixel UVC imaging PD arrays have been successfully demonstrated without any external applied bias, showing high recognition rates and practical utility for reliable UVC imaging applications. Our work not only demonstrates the feasibility of obtaining single-crystal epitaxial membranes for a wide range of material systems but also provides pathways for overcoming material limitations with defect-induced optoelectrical systems.
对于基于异质外延β-氧化镓(β-GaO)薄膜的紫外C(UVC)光电探测器(PD),载流子传导的高效率对于其光电性能至关重要。然而,由于各向异性对称性导致的面内旋转畴的存在,严重降低了传统横向PD(LPD)中载流子的捕获和复合所导致的载流子传导效率。在此,我们展示了一种方法,通过使用孔图案蓝宝石纳米膜(HPSN)生长模板进行外延层转移,在保持外延Si掺杂β-GaO(Si:GaO)高结晶度的同时实现垂直传导配置。基于对转移的外延Si:GaO膜中畴取向和光响应性的表征,我们揭示了由垂直畴间和横向畴内传导引起的与缺陷相关的各向异性传导。与LPD中间接的畴内路径相比,垂直PD(VPD)通过直接的畴间路径表现出高效率的载流子传导。结果,自供电的VPD表现出高整流特性,探测率高达1.02×10琼斯,响应时间快至93毫秒。此外,已经成功展示了多像素UVC成像PD阵列,无需任何外部施加偏压,对于可靠的UVC成像应用显示出高识别率和实际效用。我们的工作不仅证明了为广泛的材料系统获得单晶外延膜的可行性,还提供了克服缺陷诱导光电器件系统中材料限制的途径。