Ani Aninamol, Poornesh P, Antony Albin, Nagaraja K K, Rao Ashok, Hegde Gopalkrishna, Kolesnikov Evgeny, Shchetinin Igor V, Kulkarni Suresh D, Petwal Vikash Chandra, Verma Vijay Pal, Dwivedi Jishnu
Department of Physics, Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal 576104, Karnataka, India.
Department of Functional Nanosystems and High-Temperature Materials, National University of Science and Technology "MISiS", Leninskiy Pr. 4, 119049 Moscow, Russia.
Nanomaterials (Basel). 2021 Nov 22;11(11):3151. doi: 10.3390/nano11113151.
In the present investigation, electron beam-influenced modifications on the CO gas sensing properties of indium doped ZnO (IZO) thin films were reported. Dose rates of 5, 10, and 15 kGy were irradiated to the IZO nano films while maintaining the In doping concentration to be 15 wt%. The wurtzite structure of IZO films is observed from XRD studies post electron beam irradiation, confirming structural stability, even in the intense radiation environment. The surface morphological studies by SEM confirms the granular structure with distinct and sharp grain boundaries for 5 kGy and 10 kGy irradiated films whereas the IZO film irradiated at 15 kGy shows the deterioration of defined grains. The presence of defects viz oxygen vacancies, interstitials are recorded from room temperature photoluminescence (RTPL) studies. The CO gas sensing estimations were executed at an optimized operating temperature of 300 °C for 1 ppm, 2 ppm, 3 ppm, 4 ppm, and 5 ppm. The 10 kGy treated IZO film displayed an enhanced sensor response of 2.61 towards low concentrations of 1 ppm and 4.35 towards 5 ppm. The enhancement in sensor response after irradiation is assigned to the growth in oxygen vacancies and well-defined grain boundaries since the former and latter act as vital adsorption locations for the CO gas.
在本研究中,报道了电子束对铟掺杂氧化锌(IZO)薄膜的一氧化碳气体传感特性的影响。在铟掺杂浓度保持为15 wt%的情况下,对IZO纳米薄膜进行了5、10和15 kGy的剂量率辐照。通过X射线衍射(XRD)研究在电子束辐照后观察到IZO薄膜的纤锌矿结构,证实了即使在强辐射环境下其结构的稳定性。扫描电子显微镜(SEM)进行的表面形态研究证实,5 kGy和10 kGy辐照的薄膜具有明显且清晰的晶粒边界的颗粒结构,而15 kGy辐照的IZO薄膜显示出确定晶粒的劣化。通过室温光致发光(RTPL)研究记录到了诸如氧空位、间隙原子等缺陷的存在。一氧化碳气体传感评估在300 °C的优化工作温度下针对1 ppm、2 ppm、3 ppm、4 ppm和5 ppm进行。10 kGy处理的IZO薄膜对低浓度的1 ppm显示出增强的传感器响应2.61,对5 ppm显示出4.35的响应。辐照后传感器响应的增强归因于氧空位的增加和清晰的晶粒边界,因为前者和后者充当了一氧化碳气体的重要吸附位置。