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评估Zn:WO薄膜作为检测NH气体的传感层的性能。

Evaluation of Zn: WO Thin Films as a Sensing Layer for Detection of NH Gas.

作者信息

Kumari Priyanka, Poornesh P, Chattopadhyay Saikat, Rao Ashok, Kulkarni Suresh D

机构信息

Department of Physics, Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal 576104, India.

Department of Chemistry, School of Basic Sciences, Manipal University Jaipur, Jaipur 303007, India.

出版信息

Micromachines (Basel). 2023 Mar 25;14(4):732. doi: 10.3390/mi14040732.

Abstract

Pristine WO and Zn-doped WO were synthesized using the spray pyrolysis technique to detect ammonia gas. The prominent orientation of the crystallites along the (200) plane was evident from X-ray diffraction (XRD) studies. Scanning Electron Microscope (SEM) morphology indicated well-defined grains upon Zn doping with a smaller grain size of 62 nm for Zn-doped WO (Zn: WO) film. The photoluminescence (PL) emission at different wavelengths was assigned to defects such as oxygen vacancies, interstitial oxygens, localized defects, etc. X-ray Photoelectron spectroscopy (XPS) studies confirmed the formation of oxygen vacancies in the deposited films. The ammonia (NH) sensing analysis of the deposited films was carried out at an optimum working temperature of 250 °C. The sensor performance of Zn: WO was enhanced compared to pristine WO at 1 ppm NH concentration, elucidating the possibility of the films in sensing applications.

摘要

采用喷雾热解技术合成了纯净的WO和锌掺杂的WO,用于检测氨气。X射线衍射(XRD)研究表明,微晶沿(200)面的突出取向很明显。扫描电子显微镜(SEM)形态表明,锌掺杂后晶粒清晰,锌掺杂WO(Zn:WO)薄膜的晶粒尺寸较小,为62 nm。不同波长下的光致发光(PL)发射归因于氧空位、间隙氧、局部缺陷等缺陷。X射线光电子能谱(XPS)研究证实了沉积薄膜中氧空位的形成。在250℃的最佳工作温度下对沉积薄膜进行了氨气(NH)传感分析。在1 ppm NH浓度下,Zn:WO的传感器性能比纯净的WO有所提高,这说明了这些薄膜在传感应用中的可能性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a17e/10142579/b45484a5ae35/micromachines-14-00732-g001.jpg

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