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用于光电器件的基于超薄金属的广谱氧化物/金属/氧化物透明导电薄膜

Broad-Spectrum Ultrathin-Metal-Based Oxide/Metal/Oxide Transparent Conductive Films for Optoelectronic Devices.

作者信息

Liu Zhang, Zou Yalu, Ji Chengang, Chen Xinliang, Hou Guofu, Zhang Cong, Wan Xiangjian, Guo L Jay, Zhao Ying, Zhang Xiaodan

机构信息

Institute of Photo-electronic Thin Film Devices and Technology, Key Laboratory of Photo-electronic Thin Film Devices and Technology of Tianjin, College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, China.

Key Laboratory of Functional Polymer Materials, Renewable Energy Conversion and Storage Center (RECAST), College of Chemistry, Nankai University, Tianjin 300071, China.

出版信息

ACS Appl Mater Interfaces. 2021 Dec 15;13(49):58539-58551. doi: 10.1021/acsami.1c16691. Epub 2021 Dec 6.

Abstract

High-quality transparent conductive materials are beneficial to improve the charge transfer and light transmittance and reduce the interface defects as well as the production cost of optoelectronic devices. A high threshold thickness of metal layer in oxide/metal/oxide (OMO) compound thin films leads to strong reflectance, especially in the near-infrared region, limiting the broad-spectrum device applications. Here, we propose a novel Zn doping strategy using the low-cost single-target sputtering technology to achieve the growth of Ag-Zn thin films (i.e., Zn-doped Ag) and introduce a trace amount of O to further obtain ultrathin Ag-Zn(O) films (thin-film thickness ≤ 5 nm), which greatly improves the broad-spectrum characteristics of OMO films. Heterogeneous metal and gas doping technology effectively promotes the formation of two-dimensional continuous film growth. By combining the ultrathin Ag-Zn(O) layer with the MGZO (i.e., Mg- and Ga co-doped ZnO) oxide film grown by reactive plasma deposition, a typical broad-spectrum MGZO/Ag-Zn(O)/MGZO (50/5/50 nm)-OMO compound thin film exhibits an average transmittance of 91.6% in the wavelength range of 400-1200 nm and low sheet resistance. The broad-spectrum organic solar cells based on MGZO/Ag-Zn(O)/MGZO electrodes present a high power conversion efficiency of 15.35%, superior to those devices based on single-layer oxide electrodes. The distinguished performances are attributed to the ultrathin Ag-Zn(O) films in OMO, paving the way for applications in broad-spectrum optoelectronic and flexible electronic devices.

摘要

高质量的透明导电材料有利于改善电荷转移和光透射率,并减少界面缺陷以及光电器件的生产成本。氧化物/金属/氧化物(OMO)复合薄膜中金属层的高阈值厚度会导致强反射,尤其是在近红外区域,这限制了其在广谱器件中的应用。在此,我们提出一种新颖的锌掺杂策略,利用低成本的单靶溅射技术实现Ag-Zn薄膜(即锌掺杂的Ag)的生长,并引入微量的氧以进一步获得超薄的Ag-Zn(O)薄膜(薄膜厚度≤5nm),这极大地改善了OMO薄膜的广谱特性。异质金属和气体掺杂技术有效地促进了二维连续薄膜生长的形成。通过将超薄的Ag-Zn(O)层与通过反应性等离子体沉积生长的MGZO(即镁和镓共掺杂的ZnO)氧化物薄膜相结合,一种典型的广谱MGZO/Ag-Zn(O)/MGZO(50/5/50nm)-OMO复合薄膜在400-1200nm波长范围内的平均透过率为91.6%,且方阻较低。基于MGZO/Ag-Zn(O)/MGZO电极的广谱有机太阳能电池呈现出15.35%的高功率转换效率,优于基于单层氧化物电极的器件。这些卓越的性能归因于OMO中的超薄Ag-Zn(O)薄膜,为其在广谱光电器件和柔性电子器件中的应用铺平了道路。

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