Su Bo, Huang Yuan, Hou Yan Hui, Li Jiawei, Yang Rong, Ma Yongchang, Yang Yang, Zhang Guangyu, Zhou Xingjiang, Luo Jianlin, Chen Zhi-Guo
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.
School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100190, China.
Adv Sci (Weinh). 2022 Feb;9(5):e2101532. doi: 10.1002/advs.202101532. Epub 2021 Dec 19.
A van der Waals material, MoTe with a monoclinic 1T' crystal structure is a candidate for 3D second-order topological insulators (SOTIs) hosting gapless hinge states and insulating surface states. However, due to the temperature-induced structural phase transition, the monoclinic 1T' structure of MoTe is transformed into the orthorhombic T structure as the temperature is lowered, which hinders the experimental verification and electronic applications of the predicted SOTI state at low temperatures. Here, systematic Raman spectroscopy studies of the exfoliated MoTe thin flakes with variable thicknesses at different temperatures, are presented. As a spectroscopic signature of the orthorhombic T structure of MoTe , the out-of-plane vibration mode D at ≈ 125 cm is always visible below a certain temperature in the multilayer flakes thicker than ≈ 27.7 nm, but vanishes in the temperature range from 80 to 320 K when the flake thickness becomes lower than ≈ 19.5 nm. The absence of the out-of-plane vibration mode D in the Raman spectra here demonstrates not only the disappearance of the monoclinic-to-orthorhombic phase transition but also the persistence of the monoclinic 1T' structure in the MoTe thin flakes thinner than ≈ 19.5 nm at low temperatures down to 80 K, which may be caused by the high enough density of the holes introduced during the gold-enhanced exfoliation process and exposure to air. The MoTe thin flakes with the low-temperature monoclinic 1T' structure provide a material platform for realizing SOTI states in van der Waals materials at low temperatures, which paves the way for developing a new generation of electronic devices based on SOTIs.
具有单斜1T'晶体结构的范德华材料MoTe是三维二阶拓扑绝缘体(SOTI)的候选材料,可承载无隙铰链态和绝缘表面态。然而,由于温度诱导的结构相变,随着温度降低,MoTe的单斜1T'结构会转变为正交T结构,这阻碍了低温下预测的SOTI态的实验验证和电子应用。在此,展示了对不同温度下不同厚度的剥离MoTe薄片进行的系统拉曼光谱研究。作为MoTe正交T结构的光谱特征,面外振动模式D在≈125 cm处,在厚度大于≈27.7 nm的多层薄片中,在一定温度以下总是可见,但当薄片厚度低于≈19.5 nm时,在80至320 K的温度范围内消失。此处拉曼光谱中面外振动模式D的缺失不仅表明单斜到正交相变的消失,还表明在低至80 K的温度下,厚度小于≈19.5 nm的MoTe薄片中,单斜1T'结构持续存在,这可能是由于金增强剥离过程中引入的空穴密度足够高以及暴露于空气中所致。具有低温单斜1T'结构的MoTe薄片为在范德华材料中低温实现SOTI态提供了一个材料平台,这为开发基于SOTI的新一代电子器件铺平了道路。