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化学气相沉积石墨烯缩颈中的巨磁电阻

Giant Magnetoresistance in a Chemical Vapor Deposition Graphene Constriction.

作者信息

Smith Luke W, Batey Jack O, Alexander-Webber Jack A, Hsieh Yu-Chiang, Fung Shin-Jr, Albrow-Owen Tom, Beere Harvey E, Burton Oliver J, Hofmann Stephan, Ritchie David A, Kelly Michael, Chen Tse-Ming, Joyce Hannah J, Smith Charles G

机构信息

Department of Physics, Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, United Kingdom.

Department of Physics, National Cheng Kung University, Tainan 701, Taiwan.

出版信息

ACS Nano. 2022 Feb 22;16(2):2833-2842. doi: 10.1021/acsnano.1c09815. Epub 2022 Feb 3.

DOI:10.1021/acsnano.1c09815
PMID:35109656
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9098165/
Abstract

Magnetic field-driven insulating states in graphene are associated with samples of very high quality. Here, this state is shown to exist in monolayer graphene grown by chemical vapor deposition (CVD) and wet transferred on AlO without encapsulation with hexagonal boron nitride (-BN) or other specialized fabrication techniques associated with superior devices. Two-terminal measurements are performed at low temperature using a GaAs-based multiplexer. During high-throughput testing, insulating properties are found in a 10 μm long graphene device which is 10 μm wide at one contact with an ≈440 nm wide constriction at the other. The low magnetic field mobility is ≈6000 cm V s. An energy gap induced by the magnetic field opens at charge neutrality, leading to diverging resistance and current switching on the order of 10 with DC bias voltage at an approximate electric field strength of ≈0.04 V μm at high magnetic field. DC source-drain bias measurements show behavior associated with tunneling through a potential barrier and a transition between direct tunneling at low bias to Fowler-Nordheim tunneling at high bias from which the tunneling region is estimated to be on the order of ≈100 nm. Transport becomes activated with temperature from which the gap size is estimated to be 2.4 to 2.8 meV at = 10 T. Results suggest that a local electronically high quality region exists within the constriction, which dominates transport at high , causing the device to become insulating and act as a tunnel junction. The use of wet transfer fabrication techniques of CVD material without encapsulation with -BN and the combination with multiplexing illustrates the convenience of these scalable and reasonably simple methods to find high quality devices for fundamental physics research and with functional properties.

摘要

石墨烯中的磁场驱动绝缘态与非常高质量的样品相关。在此,这种状态被证明存在于通过化学气相沉积(CVD)生长并湿法转移到AlO上且未用六方氮化硼(-BN)封装或采用与优质器件相关的其他专门制造技术的单层石墨烯中。使用基于砷化镓的多路复用器在低温下进行两端测量。在高通量测试期间,在一个10μm长、10μm宽且一端接触处宽度为10μm、另一端有一个约440nm宽缩颈的石墨烯器件中发现了绝缘特性。低磁场迁移率约为6000 cm² V⁻¹ s⁻¹。由磁场诱导的能隙在电荷中性时打开,导致电阻发散,并且在高磁场下,当直流偏置电压约为0.04 V μm的近似电场强度时,电流切换幅度约为10。直流源漏偏置测量显示出与通过势垒隧穿以及从低偏置下的直接隧穿到高偏置下的福勒 - 诺德海姆隧穿之间的转变相关的行为,据此估计隧穿区域约为100nm量级。输运随温度激活,据此估计在B = 10 T时能隙大小为2.4至2.8 meV。结果表明,在缩颈处存在一个局部电子高质量区域,该区域在高磁场下主导输运,使器件变为绝缘并充当隧道结。使用未用 -BN封装的CVD材料的湿法转移制造技术以及与多路复用的结合,说明了这些可扩展且相当简单的方法对于寻找用于基础物理研究和具有功能特性的高质量器件的便利性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/ddbd9c8fa5d1/nn1c09815_0005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/08e311af6d83/nn1c09815_0001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/eed4f0980332/nn1c09815_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/f1ad68f19f28/nn1c09815_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/4f2f3fba11ba/nn1c09815_0004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/ddbd9c8fa5d1/nn1c09815_0005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/08e311af6d83/nn1c09815_0001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/eed4f0980332/nn1c09815_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/f1ad68f19f28/nn1c09815_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/4f2f3fba11ba/nn1c09815_0004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ad68/9098165/ddbd9c8fa5d1/nn1c09815_0005.jpg

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