• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

采用精确芯片成型法测量铜膜的剪切强度

Measurement of Shear Strengths of Cu Films Using Precise Chip Forming.

作者信息

Lee Jeong-Heon, Kwak Jae B

机构信息

School of Mechanical System and Automotive Engineering, Chosun University, 309 Pilmun-daero, Gwangju 61452, Korea.

Department of Mechanical Engineering, Chosun University, 309 Pilmun-daero, Gwangju 61452, Korea.

出版信息

Materials (Basel). 2022 Jan 26;15(3):948. doi: 10.3390/ma15030948.

DOI:10.3390/ma15030948
PMID:35160891
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8838378/
Abstract

The mechanical properties of thin films are under-researched because of the challenges associated with conventional experimental methods. We demonstrate a technique for determining the intrinsic shear strength and strain of thin films using a nano-cutting technique based on an orthogonal cutting model with precise control of the cutting system. In this study, electroplated Cu films with thicknesses of 1.5 μm and 5 μm and a sputtered Cu film with a thickness of 130 nm were fabricated to evaluate the mechanical strength. Experiments revealed a shear strength of approximately 310 MPa with a shear strain of 1.57 for the electroplated Cu film and a shear strength of 389 MPa with a shear strain of 2.03 for the sputtered Cu film. In addition, X-ray diffraction analysis was performed to correlate the experimental results.

摘要

由于传统实验方法存在挑战,薄膜的力学性能研究不足。我们展示了一种使用基于正交切削模型的纳米切削技术来确定薄膜固有剪切强度和应变的技术,该技术对切削系统有精确控制。在本研究中,制备了厚度为1.5μm和5μm的电镀铜薄膜以及厚度为130nm的溅射铜薄膜,以评估其机械强度。实验表明,电镀铜薄膜的剪切强度约为310MPa,剪切应变为1.57;溅射铜薄膜的剪切强度为389MPa,剪切应变为2.03。此外,还进行了X射线衍射分析以关联实验结果。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/b4445dadfb48/materials-15-00948-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/f931a0aa9261/materials-15-00948-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/ae309eaf259f/materials-15-00948-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/2f9b055cd5b0/materials-15-00948-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/109071813645/materials-15-00948-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/b4445dadfb48/materials-15-00948-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/f931a0aa9261/materials-15-00948-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/ae309eaf259f/materials-15-00948-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/2f9b055cd5b0/materials-15-00948-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/109071813645/materials-15-00948-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7dea/8838378/b4445dadfb48/materials-15-00948-g005.jpg

相似文献

1
Measurement of Shear Strengths of Cu Films Using Precise Chip Forming.采用精确芯片成型法测量铜膜的剪切强度
Materials (Basel). 2022 Jan 26;15(3):948. doi: 10.3390/ma15030948.
2
Effect of De-Twinning on Tensile Strength of Nano-Twinned Cu Films.去孪晶对纳米孪晶铜薄膜拉伸强度的影响。
Nanomaterials (Basel). 2021 Jun 22;11(7):1630. doi: 10.3390/nano11071630.
3
Influence of the Silver Content on Mechanical Properties of Ti-Cu-Ag Thin Films.银含量对Ti-Cu-Ag薄膜力学性能的影响。
Nanomaterials (Basel). 2021 Feb 9;11(2):435. doi: 10.3390/nano11020435.
4
Copper(L) selenide thin films deposited by a solution-based method for photovoltaic applications.通过基于溶液的方法沉积的用于光伏应用的硒化亚铜(I)薄膜。
J Nanosci Nanotechnol. 2013 Mar;13(3):2391-5. doi: 10.1166/jnn.2013.7097.
5
Mechanical performance of co-deposited immiscible Cu-Ta thin films.共沉积不混溶Cu-Ta薄膜的力学性能
Sci Rep. 2020 Oct 20;10(1):17775. doi: 10.1038/s41598-020-74903-2.
6
Relation between electrical properties of aerosol-deposited BaTiO3 thin films and their mechanical hardness measured by nano-indentation.气溶胶沉积的钛酸钡(BaTiO₃)薄膜的电学性质与其通过纳米压痕测量的机械硬度之间的关系。
Nanoscale Res Lett. 2012 May 22;7(1):264. doi: 10.1186/1556-276X-7-264.
7
Pronounced Impact of -Type Carriers and Reduction of Bandgap in Semiconducting ZnTe Thin Films by Cu Doping for Intermediate Buffer Layer in Heterojunction Solar Cells.通过铜掺杂对异质结太阳能电池中间缓冲层的半导体碲化锌薄膜进行-型载流子的显著影响及带隙降低
Materials (Basel). 2019 Apr 25;12(8):1359. doi: 10.3390/ma12081359.
8
Phase Competition Induced Bio-Electrochemical Resistance and Bio-Compatibility Effect in Nanocrystalline Zr-Cu Thin Films.纳米晶Zr-Cu薄膜中相竞争诱导的生物电化学抗性和生物相容性效应
J Nanosci Nanotechnol. 2018 Jul 1;18(7):4534-4543. doi: 10.1166/jnn.2018.15270.
9
Effect of Sintering Conditions on the Mechanical Strength of Cu-Sintered Joints for High-Power Applications.烧结条件对高功率应用中铜烧结接头机械强度的影响。
Materials (Basel). 2018 Oct 26;11(11):2105. doi: 10.3390/ma11112105.
10
Roll-to-Roll sputtered ITO/Cu/ITO multilayer electrode for flexible, transparent thin film heaters and electrochromic applications.用于柔性透明薄膜加热器和电致变色应用的卷对卷溅射氧化铟锡/铜/氧化铟锡多层电极。
Sci Rep. 2016 Sep 22;6:33868. doi: 10.1038/srep33868.

本文引用的文献

1
Deformation behavior of Re alloyed Mo thin films on flexible substrates: In situ fragmentation analysis supported by first-principles calculations.在柔性衬底上的 Re 合金化 Mo 薄膜的变形行为:基于第一性原理计算的原位断裂分析。
Sci Rep. 2017 Aug 7;7(1):7374. doi: 10.1038/s41598-017-07825-1.
2
Nano-indentation of single-layer optical oxide thin films grown by electron-beam deposition.电子束沉积法生长的单层光学氧化物薄膜的纳米压痕
Appl Opt. 2015 Mar 20;54(9):2435-40. doi: 10.1364/AO.54.002435.