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通过使用铟和锡催化剂的等离子体辅助汽-液-固法合成的无锥度单晶锗纳米线。

Tapering-free monocrystalline Ge nanowires synthesized via plasma-assisted VLS using In and Sn catalysts.

作者信息

Tang Jian, Wang Jun, Maurice Jean-Luc, Chen Wanghua, Foldyna Martin, Yu Linwei, Leshchenko Egor D, Dubrovskii Vladimir G, Cabarrocas Pere Roca I

机构信息

International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen 518060, People's Republic of China.

LPICM, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, F-91128 Palaiseau, France.

出版信息

Nanotechnology. 2022 Jul 14;33(40). doi: 10.1088/1361-6528/ac57d4.

Abstract

In and Sn are the type of catalysts which do not introduce deep level electrical defects within the bandgap of germanium (Ge). However, Ge nanowires produced using these catalysts usually have a large diameter, a tapered morphology, and mixed crystalline and amorphous phases. In this study, we show that plasma-assisted vapor-liquid-solid (PA-VLS) method can be used to synthesize Ge nanowires. Moreover, at certain parameter domains, the sidewall deposition issues of this synthesis method can be avoided and long, thin tapering-free monocrystalline Ge nanowires can be obtained with In and Sn catalysts. We find two quite different parameter domains where Ge nanowire growth can occur via PA-VLS using In and Sn catalysts: (i) a low temperature-low pressure domain, below ∼235 °C at a GeHpartial pressure of ∼6 mTorr, where supersaturation in the catalyst occurs thanks to the low solubility of Ge in the catalysts, and (ii) a high temperature-high pressure domain, at ∼400 °C and a GeHpartial pressure above ∼20 mTorr, where supersaturation occurs thanks to the high GeHconcentration. While growth at 235 °C results in tapered short wires, operating at 400 °C enables cylindrical nanowire growth. With the increase of growth temperature, the crystalline structure of the nanowires changes from multi-crystalline to mono-crystalline and their growth rate increases from ∼0.3 nm sto 5 nm s. The cylindrical Ge nanowires grown at 400°C usually have a length of few microns and a radius of around 10 nm, which is well below the Bohr exciton radius in bulk Ge (24.3 nm). To explain the growth mechanism, a detailed growth model based on the key chemical reactions is provided.

摘要

铟(In)和锡(Sn)是不会在锗(Ge)的带隙内引入深能级电缺陷的催化剂类型。然而,使用这些催化剂制备的锗纳米线通常具有较大的直径、锥形形态以及混合的晶体和非晶相。在本研究中,我们表明等离子体辅助气-液-固(PA-VLS)方法可用于合成锗纳米线。此外,在特定参数范围内,可以避免这种合成方法的侧壁沉积问题,并且使用铟和锡催化剂可以获得长的、细的、无锥度的单晶锗纳米线。我们发现了两个截然不同的参数范围,在这些范围内可以通过使用铟和锡催化剂的PA-VLS方法生长锗纳米线:(i)低温-低压范围,在锗分压约为6毫托时温度低于约235°C,由于锗在催化剂中的低溶解度,催化剂中会出现过饱和现象;(ii)高温-高压范围,在约400°C且锗分压高于约20毫托时,由于锗烷(GeH)浓度高而出现过饱和现象。虽然在235°C下生长会产生锥形短导线,但在400°C下操作可实现圆柱形纳米线的生长。随着生长温度的升高,纳米线的晶体结构从多晶变为单晶,其生长速率从约0.3纳米/秒增加到5纳米/秒。在400°C下生长制备的圆柱形锗纳米线通常长度为几微米,半径约为10纳米,远低于块状锗中的玻尔激子半径(24.3纳米)。为了解释生长机制,提供了一个基于关键化学反应的详细生长模型。

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